André Engelen
André Engelen publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Advanced Surface Polishing Techniques.
- World rank
- #5,897,568 of 7,710,434 ranked researchers
- Rank in Netherlands
- #97,686 of 107,149
- Works
- 24
- Citations
- 255
- Citations per work
- 10.6
What does André Engelen research?
André Engelen's work is mostly in Engineering (76%), Materials Science (11%), Computer Science (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2290.3%
- Engineering1876.4%
- Materials Science311.1%
- Computer Science12.8%
- Everything else29.7%
- 1Electrical and Electronic Engineering49% of their works
- 2Biomedical Engineering15% of their works
- 3Surfaces, Coatings and Films11% of their works
- 4Industrial and Manufacturing Engineering8% of their works
- 5Mechanical Engineering4% of their works
- 6Computer Vision and Pattern Recognition3% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Industrial Vision Systems and Defect Detection
- Electron and X-Ray Spectroscopy Techniques
- Advanced Measurement and Metrology Techniques
- Optical Coatings and Gratings
- Optical measurement and interference techniques
Which keywords describe André Engelen's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Failure Analysis, Integrated Circuits, Chemical Mechanical Planarization, Material Removal Mechanism and Fabric Defect Detection.
- Camera Calibration
- Error Compensation
- Antireflective Coatings
- Scanning Electron Microscopy
- Fabric Defect Detection
- Chemical Mechanical Planarization
- Failure Analysis
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- Integrated Circuits
- Material Removal Mechanism
- Machine Vision
- X-ray Photoelectron Spectroscopy
- Dimensional Metrology
- Nanostructures
- Structured Light
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Nanofabrication232 topics
- Electron Beam Lithography201 topic
- Resolution Limits201 topic
- Failure Analysis121 topic
- Integrated Circuits121 topic
- Chemical Mechanical Planarization91 topic
- Material Removal Mechanism91 topic
- Fabric Defect Detection61 topic
- Machine Vision61 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Antireflective Coatings31 topic
- Dimensional Metrology31 topic
- Error Compensation31 topic
- Nanostructures31 topic
- Camera Calibration21 topic
- Structured Light21 topic
Where does André Engelen work?
André Engelen's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does André Engelen have?
OpenAlex counts 24 works and 255 citations for André Engelen, an h-index of 8, ranking #5,897,568 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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