Bart Baudemprez
Bart Baudemprez publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Mechanical Engineering, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,288,876 of 7,710,434 ranked researchers
- Rank in Belgium
- #63,069 of 67,186
- Works
- 25
- Citations
- 220
- Citations per work
- 8.8
What does Bart Baudemprez research?
Bart Baudemprez's work is mostly in Engineering (70%), Materials Science (27%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2497.1%
- Engineering1870.3%
- Materials Science726.8%
- Everything else12.9%
- 1Electrical and Electronic Engineering56% of their works
- 2Surfaces, Coatings and Films27% of their works
- 3Mechanical Engineering6% of their works
- 4Computational Mechanics4% of their works
- 5Industrial and Manufacturing Engineering3% of their works
- 6Automotive Engineering1% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Optical Coatings and Gratings
- Surface Roughness and Optical Measurements
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Advanced Measurement and Metrology Techniques
Which keywords describe Bart Baudemprez's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis, Integrated Circuits and Antireflective Coatings.
- Error Compensation
- Atomic Layer Deposition
- Surface Characterization
- Nanowire Transistors
- Antireflective Coatings
- Failure Analysis
- Scanning Electron Microscopy
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- X-ray Photoelectron Spectroscopy
- Integrated Circuits
- Nanostructures
- Roughness Measurement
- Tunnel Field-Effect Transistors
- Dimensional Metrology
- High-k Dielectrics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Nanofabrication252 topics
- Electron Beam Lithography201 topic
- Resolution Limits201 topic
- Scanning Electron Microscopy141 topic
- X-ray Photoelectron Spectroscopy141 topic
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Antireflective Coatings51 topic
- Nanostructures51 topic
- Nanowire Transistors31 topic
- Roughness Measurement31 topic
- Surface Characterization31 topic
- Tunnel Field-Effect Transistors31 topic
- Atomic Layer Deposition21 topic
- Dimensional Metrology21 topic
- Error Compensation21 topic
- High-k Dielectrics21 topic
Where does Bart Baudemprez work?
Bart Baudemprez's main affiliation in the publication record is IMEC, Belgium.
How many publications and citations does Bart Baudemprez have?
OpenAlex counts 25 works and 220 citations for Bart Baudemprez, an h-index of 9, ranking #7,288,876 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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