Bruce W. Dudley
Bruce W. Dudley publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Advanced Surface Polishing Techniques and Semiconductor materials and devices.
- World rank
- #7,084,195 of 7,710,434 ranked researchers
- Rank in United States
- #1,581,941 of 1,627,098
- Works
- 30
- Citations
- 243
- Citations per work
- 8.1
What does Bruce W. Dudley research?
Bruce W. Dudley's work is mostly in Engineering (71%), Materials Science (10%), Physics and Astronomy (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2584.3%
- Engineering2171.1%
- Materials Science39.6%
- Physics and Astronomy13.6%
- Everything else515.7%
- 1Electrical and Electronic Engineering41% of their works
- 2Biomedical Engineering18% of their works
- 3Surfaces, Coatings and Films10% of their works
- 4Mechanical Engineering8% of their works
- 5Atomic and Molecular Physics, and Optics4% of their works
- 6Computational Mechanics4% of their works
Research topics
- Advancements in Photolithography Techniques
- Advanced Surface Polishing Techniques
- Semiconductor materials and devices
- Optical Coatings and Gratings
- Nanofabrication and Lithography Techniques
- Thin-Film Transistor Technologies
- Advanced Measurement and Metrology Techniques
- Electron and X-Ray Spectroscopy Techniques
Which keywords describe Bruce W. Dudley's research?
The keywords of their largest research topics: Nanofabrication, High-Resolution Patterning, Electron Beam Lithography, Resolution Limits, Chemical Mechanical Planarization, Material Removal Mechanism, Solar Cells and Antireflective Coatings.
- Thin-Film Transistors
- Scanning Electron Microscopy
- Nanolithography
- Dimensional Metrology
- High-k Dielectrics
- Antireflective Coatings
- Material Removal Mechanism
- Resolution Limits
- High-Resolution Patterning
- Nanofabrication
- Electron Beam Lithography
- Chemical Mechanical Planarization
- Solar Cells
- Atomic Layer Deposition
- Nanostructures
- Error Compensation
- Plasmonics
- Soft Lithography
- X-ray Photoelectron Spectroscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Nanofabrication212 topics
- High-Resolution Patterning192 topics
- Electron Beam Lithography161 topic
- Resolution Limits161 topic
- Chemical Mechanical Planarization81 topic
- Material Removal Mechanism81 topic
- Solar Cells82 topics
- Antireflective Coatings51 topic
- Atomic Layer Deposition51 topic
- High-k Dielectrics51 topic
- Nanostructures51 topic
- Dimensional Metrology31 topic
- Error Compensation31 topic
- Nanolithography31 topic
- Plasmonics31 topic
- Scanning Electron Microscopy31 topic
- Soft Lithography31 topic
- Thin-Film Transistors31 topic
- X-ray Photoelectron Spectroscopy31 topic
Where does Bruce W. Dudley work?
Bruce W. Dudley's main affiliation in the publication record is MCNC Research and Development Institute, United States.
How many publications and citations does Bruce W. Dudley have?
OpenAlex counts 30 works and 243 citations for Bruce W. Dudley, an h-index of 8, ranking #7,084,195 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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