C. Leyris
C. Leyris publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics, on topics such as Advancements in Semiconductor Devices and Circuit Design, Semiconductor materials and devices and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #1,957,568 of 7,710,434 ranked researchers
- Rank in France
- #85,525 of 324,115
- Works
- 28
- Citations
- 662
- Citations per work
- 23.6
What does C. Leyris research?
C. Leyris's work is mostly in Engineering (93%), Physics and Astronomy (6%), Biochemistry, Genetics and Molecular Biology (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2898.9%
- Engineering2692.9%
- Physics and Astronomy26.0%
- Life Sciences01.2%
- 1Electrical and Electronic Engineering87% of their works
- 2Biomedical Engineering5% of their works
- 3Atomic and Molecular Physics, and Optics5% of their works
- 4Media Technology1% of their works
- 5Structural Biology1% of their works
- 6Instrumentation1% of their works
Research topics
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- CCD and CMOS Imaging Sensors
- Radio Frequency Integrated Circuit Design
- Thin-Film Transistor Technologies
- Low-power high-performance VLSI design
- Ferroelectric and Negative Capacitance Devices
Which keywords describe C. Leyris's research?
The keywords of their largest research topics: Process Variation, Nanowire Transistors, Tunnel Field-Effect Transistors, Atomic Layer Deposition, High-k Dielectrics, Integrated Circuits, Failure Analysis and Photon Emission Microscopy.
- VLSI Circuits
- Hafnium Oxide
- Thin-Film Transistors
- Oscillators
- High-Speed Imaging
- Photon Emission Microscopy
- Integrated Circuits
- Atomic Layer Deposition
- Nanowire Transistors
- Process Variation
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- Failure Analysis
- CMOS Image Sensors
- CMOS
- Plasmonics
- Ferroelectricity
- Low-Power
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Process Variation242 topics
- Nanowire Transistors211 topic
- Tunnel Field-Effect Transistors211 topic
- Atomic Layer Deposition171 topic
- High-k Dielectrics171 topic
- Integrated Circuits112 topics
- Failure Analysis71 topic
- Photon Emission Microscopy71 topic
- CMOS Image Sensors51 topic
- High-Speed Imaging51 topic
- CMOS41 topic
- Oscillators41 topic
- Plasmonics41 topic
- Thin-Film Transistors41 topic
- Ferroelectricity31 topic
- Hafnium Oxide31 topic
- Low-Power31 topic
- VLSI Circuits31 topic
Where does C. Leyris work?
C. Leyris's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does C. Leyris have?
OpenAlex counts 28 works and 662 citations for C. Leyris, an h-index of 13, ranking #1,957,568 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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