D. Nee
D. Nee publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering, on topics such as Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis and VLSI and Analog Circuit Testing.
- World rank
- #7,042,729 of 7,710,434 ranked researchers
- Rank in France
- #298,327 of 324,115
- Works
- 19
- Citations
- 68
- Citations per work
- 3.6
What does D. Nee research?
D. Nee's work is mostly in Engineering (73%), Computer Science (20%), Chemical Engineering (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1894.5%
- Engineering1472.7%
- Computer Science420.0%
- Chemical Engineering01.8%
- Everything else15.5%
- 1Electrical and Electronic Engineering66% of their works
- 2Hardware and Architecture18% of their works
- 3Biomedical Engineering4% of their works
- 4Aerospace Engineering4% of their works
- 5Bioengineering2% of their works
- 6Computer Networks and Communications2% of their works
Research topics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
- Electromagnetic Compatibility and Noise Suppression
- Analytical Chemistry and Sensors
Which keywords describe D. Nee's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Process Variation, Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression and Nanowire Transistors.
- Ion-Selective Electrodes
- Memristor
- EMI
- Low-Power
- Nanowire Transistors
- Embedded Cores
- Failure Analysis
- High-k Dielectrics
- Atomic Layer Deposition
- Process Variation
- Integrated Circuits
- Test Data Compression
- Tunnel Field-Effect Transistors
- VLSI Circuits
- Electromagnetic Compatibility
- Neuromorphic Computing
- Optical Sensors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Process Variation102 topics
- Failure Analysis91 topic
- Integrated Circuits91 topic
- Embedded Cores81 topic
- Test Data Compression81 topic
- Nanowire Transistors61 topic
- Tunnel Field-Effect Transistors61 topic
- Low-Power41 topic
- VLSI Circuits41 topic
- EMI21 topic
- Electromagnetic Compatibility21 topic
- Memristor21 topic
- Neuromorphic Computing21 topic
- Ion-Selective Electrodes11 topic
- Optical Sensors11 topic
Where does D. Nee work?
D. Nee's main affiliation in the publication record is Château Gombert, France.
How many publications and citations does D. Nee have?
OpenAlex counts 19 works and 68 citations for D. Nee, an h-index of 5, ranking #7,042,729 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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