Question 1

What does David E. Verbitsky research?

Accepted Answer

David E. Verbitsky publishes mostly in Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering and Control and Systems Engineering, on topics such as Reliability and Maintenance Optimization, Fault Detection and Control Systems and VLSI and Analog Circuit Testing.

Question 2

Which keywords describe David E. Verbitsky's research?

Accepted Answer

The keywords of their largest research topics: Maintenance Optimization, Reliability Engineering, Fault Detection, Process Monitoring, Embedded Cores, Test Data Compression, Architecture-Based Approach and Bayesian Networks.

Question 3

Where does David E. Verbitsky work?

Accepted Answer

David E. Verbitsky's main affiliation in the publication record is AT&T (United States), United States.

Question 4

How many publications and citations does David E. Verbitsky have?

Accepted Answer

OpenAlex counts 17 works and 98 citations for David E. Verbitsky, an h-index of 7, ranking #6,417,701 of 7,710,434 researchers worldwide on the quality score.

Question 5

Is David E. Verbitsky's h-index high?

Accepted Answer

An h-index of 7 is at or above that of 53% of the 5,818 ranked researchers whose main subfield is Safety, Risk, Reliability and Quality, which is in the top 54%.

Discussion