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Researcher · AT&T (United States) · United States

David E. Verbitsky

David E. Verbitsky publishes mostly in Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering and Control and Systems Engineering, on topics such as Reliability and Maintenance Optimization, Fault Detection and Control Systems and VLSI and Analog Circuit Testing.

ORCID 0000-0002-1573-9567 OpenAlex
World rank
#6,417,701
of 7,710,434 ranked researchers
Rank in United States
#1,515,663
of 1,627,098
Works
17
Citations
98
Citations per work
5.8
h-index
7
i10-index 4Top 54% in Safety, Risk, Reliability and Quality
David E. Verbitsky

What does David E. Verbitsky research?

David E. Verbitsky's work is mostly in Engineering (57%), Computer Science (22%), Decision Sciences (12%).

Physical Sciences: 13 works · 78.4% of their workEngineering: 10 works · 56.8% of their workSafety, Risk, Reliability and Quality: 4 works · 23.5% of their workElectrical and Electronic Engineering: 3 works · 17.6% of their workControl and Systems Engineering: 3 works · 15.7% of their workComputer Science: 4 works · 21.6% of their workHardware and Architecture: 2 works · 11.8% of their workSoftware: 2 works · 9.8% of their workSocial Sciences: 2 works · 11.8% of their workDecision Sciences: 2 works · 11.8% of their workStatistics, Probability and Uncertainty: 2 works · 11.8% of their workEverything else: 2 works · 9.8% of their workTHEIR WORKDavid E.Verbitsky17works
Physical Sciences78%Social Sciences12%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1056.8%
    2. Computer Science421.6%
    1. Decision Sciences211.8%
  3. Everything else29.8%
  1. 1Safety, Risk, Reliability and Quality24% of their works
  2. 2Electrical and Electronic Engineering18% of their works
  3. 3Control and Systems Engineering16% of their works
  4. 4Statistics, Probability and Uncertainty12% of their works
  5. 5Hardware and Architecture12% of their works
  6. 6Software10% of their works

Research topics

Which keywords describe David E. Verbitsky's research?

The keywords of their largest research topics: Maintenance Optimization, Reliability Engineering, Fault Detection, Process Monitoring, Embedded Cores, Test Data Compression, Architecture-Based Approach and Bayesian Networks.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 16 words, with their numbers
  1. Maintenance Optimization101 topic
  2. Reliability Engineering101 topic
  3. Fault Detection71 topic
  4. Process Monitoring71 topic
  5. Embedded Cores61 topic
  6. Test Data Compression61 topic
  7. Architecture-Based Approach51 topic
  8. Bayesian Networks51 topic
  9. Fault Tree Analysis51 topic
  10. Software Reliability Modeling51 topic
  11. Failure Analysis31 topic
  12. Integrated Circuits31 topic
  13. EMI21 topic
  14. Electromagnetic Compatibility21 topic
  15. Interfacial Reactions21 topic
  16. Lead-free Solders21 topic

Where does David E. Verbitsky work?

David E. Verbitsky's main affiliation in the publication record is AT&T (United States), United States.

How many publications and citations does David E. Verbitsky have?

OpenAlex counts 17 works and 98 citations for David E. Verbitsky, an h-index of 7, ranking #6,417,701 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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