Researcher · AT&T (United States) · United States
David E. Verbitsky
David E. Verbitsky publishes mostly in Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering and Control and Systems Engineering, on topics such as Reliability and Maintenance Optimization, Fault Detection and Control Systems and VLSI and Analog Circuit Testing.
- World rank
- #6,417,701 of 7,710,434 ranked researchers
- Rank in United States
- #1,515,663 of 1,627,098
- Works
- 17
- Citations
- 98
- Citations per work
- 5.8
Drawing this view