Donis G. Flagello
Donis G. Flagello publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Optical Coatings and Gratings and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #6,385,356 of 7,710,434 ranked researchers
- Rank in Netherlands
- #101,294 of 107,149
- Works
- 65
- Citations
- 760
- Citations per work
- 11.7
What does Donis G. Flagello research?
Donis G. Flagello's work is mostly in Engineering (71%), Materials Science (20%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences5990.3%
- Engineering4670.7%
- Materials Science1319.6%
- Everything else69.7%
- 1Electrical and Electronic Engineering47% of their works
- 2Surfaces, Coatings and Films20% of their works
- 3Biomedical Engineering14% of their works
- 4Industrial and Manufacturing Engineering5% of their works
- 5Mechanical Engineering3% of their works
- 6Computational Mechanics2% of their works
Research topics
- Advancements in Photolithography Techniques
- Optical Coatings and Gratings
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Advanced Surface Polishing Techniques
- Advanced optical system design
- Semiconductor Lasers and Optical Devices
- Industrial Vision Systems and Defect Detection
Which keywords describe Donis G. Flagello's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Antireflective Coatings, Nanostructures, Failure Analysis, Integrated Circuits and Scanning Electron Microscopy.
- Optical Interconnects
- Fabric Defect Detection
- Compound Eyes
- Chemical Mechanical Planarization
- Scanning Electron Microscopy
- Failure Analysis
- Antireflective Coatings
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- Nanostructures
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Material Removal Mechanism
- Freeform Optics
- Machine Vision
- Semiconductor Lasers
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Nanofabrication732 topics
- Electron Beam Lithography521 topic
- Resolution Limits521 topic
- Antireflective Coatings211 topic
- Nanostructures211 topic
- Failure Analysis161 topic
- Integrated Circuits161 topic
- Scanning Electron Microscopy151 topic
- X-ray Photoelectron Spectroscopy151 topic
- Chemical Mechanical Planarization101 topic
- Material Removal Mechanism101 topic
- Compound Eyes81 topic
- Freeform Optics81 topic
- Fabric Defect Detection61 topic
- Machine Vision61 topic
- Optical Interconnects61 topic
- Semiconductor Lasers61 topic
Where does Donis G. Flagello work?
Donis G. Flagello's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Donis G. Flagello have?
OpenAlex counts 65 works and 760 citations for Donis G. Flagello, an h-index of 15, ranking #6,385,356 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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