F. Schäfers
F. Schäfers publishes mostly in Radiation, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, on topics such as X-ray Spectroscopy and Fluorescence Analysis, Advanced X-ray Imaging Techniques and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #69,528 of 1,633,909 ranked researchers
- Rank in Germany
- #4,634 of 86,443
- Works
- 53
- Citations
- 364
- Citations per work
- 6.9
What does F. Schäfers research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Radiation43% of their works
- 2Atomic and Molecular Physics, and Optics14% of their works
- 3Electrical and Electronic Engineering11% of their works
- 4Surfaces, Coatings and Films8% of their works
- 5Condensed Matter Physics7% of their works
- 6Biomedical Engineering6% of their works
Research topics
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced X-ray Imaging Techniques
- Electron and X-Ray Spectroscopy Techniques
- Crystallography and Radiation Phenomena
- Advanced Materials Characterization Techniques
- Particle Accelerators and Free-Electron Lasers
- Magnetic properties of thin films
- Semiconductor materials and devices
Which keywords describe F. Schäfers's research?
The keywords of their largest research topics: Quantitative Analysis, Phase Retrieval, Spectroscopy, X-ray Absorption, X-ray Imaging, Synchrotron Radiation, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.
- High-k Dielectrics
- X-Ray
- Spintronics
- Free-Electron Lasers
- Nuclear Resonant Spectroscopy
- X-ray Photoelectron Spectroscopy
- Synchrotron Radiation
- X-ray Absorption
- Phase Retrieval
- Quantitative Analysis
- Spectroscopy
- X-ray Imaging
- Scanning Electron Microscopy
- Channeling
- Atom Probe Tomography
- Skyrmions
- Three-Dimensional Analysis
- Atomic Layer Deposition
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Quantitative Analysis182 topics
- Phase Retrieval151 topic
- Spectroscopy151 topic
- X-ray Absorption151 topic
- X-ray Imaging151 topic
- Synchrotron Radiation82 topics
- Scanning Electron Microscopy61 topic
- X-ray Photoelectron Spectroscopy61 topic
- Channeling51 topic
- Nuclear Resonant Spectroscopy51 topic
- Atom Probe Tomography31 topic
- Free-Electron Lasers31 topic
- Skyrmions31 topic
- Spintronics31 topic
- Three-Dimensional Analysis31 topic
- X-Ray31 topic
- Atomic Layer Deposition21 topic
- High-k Dielectrics21 topic
Where does F. Schäfers work?
F. Schäfers's main affiliation in the publication record is Helmholtz-Zentrum Berlin für Materialien und Energie, Germany.
How many publications and citations does F. Schäfers have?
Science Explorer counts 53 works and 364 citations for F. Schäfers, ranking #69,528 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.