F. Schulz
F. Schulz publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Radiation, on topics such as Ion-surface interactions and analysis, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #3,226,077 of 7,710,434 ranked researchers
- Rank in Germany
- #160,632 of 364,343
- Works
- 36
- Citations
- 585
- Citations per work
- 16.3
What does F. Schulz research?
F. Schulz's work is mostly in Engineering (40%), Physics and Astronomy (19%), Materials Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2466.0%
- Engineering1439.8%
- Physics and Astronomy719.4%
- Materials Science26.8%
- Everything else1234.0%
- 1Electrical and Electronic Engineering18% of their works
- 2Computational Mechanics16% of their works
- 3Radiation13% of their works
- 4Atomic and Molecular Physics, and Optics7% of their works
- 5Surfaces, Coatings and Films7% of their works
- 6Aerospace Engineering6% of their works
Research topics
- Ion-surface interactions and analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Mass Spectrometry Techniques and Applications
- Particle accelerators and beam dynamics
- Nuclear Physics and Applications
- Silicon and Solar Cell Technologies
Which keywords describe F. Schulz's research?
The keywords of their largest research topics: Ion Beam, Surface Analysis, Failure Analysis, Integrated Circuits, Scanning Electron Microscopy, Spectroscopy, X-ray Absorption and X-ray Photoelectron Spectroscopy.
- Solar Cells
- Superconducting Cavities
- Neutron Imaging
- Mass Spectrometry
- X-ray Photoelectron Spectroscopy
- Spectroscopy
- Integrated Circuits
- Surface Analysis
- Ion Beam
- Failure Analysis
- Scanning Electron Microscopy
- X-ray Absorption
- Ionization
- Negative Ion Sources
- Small-Angle Scattering
- Silicon
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Ion Beam171 topic
- Surface Analysis171 topic
- Failure Analysis71 topic
- Integrated Circuits71 topic
- Scanning Electron Microscopy71 topic
- Spectroscopy71 topic
- X-ray Absorption71 topic
- X-ray Photoelectron Spectroscopy71 topic
- Ionization61 topic
- Mass Spectrometry61 topic
- Negative Ion Sources61 topic
- Neutron Imaging61 topic
- Small-Angle Scattering61 topic
- Superconducting Cavities61 topic
- Silicon51 topic
- Solar Cells51 topic
Where does F. Schulz work?
F. Schulz's main affiliation in the publication record is Munich Security Conference, Germany.
How many publications and citations does F. Schulz have?
OpenAlex counts 36 works and 585 citations for F. Schulz, an h-index of 11, ranking #3,226,077 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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