Frank M. Cerio
Frank M. Cerio publishes mostly in Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials, on topics such as Semiconductor materials and devices, Copper Interconnects and Reliability and Metal and Thin Film Mechanics.
- World rank
- #5,011,999 of 7,710,434 ranked researchers
- Rank in United States
- #1,299,865 of 1,627,098
- Works
- 29
- Citations
- 351
- Citations per work
- 12.1
What does Frank M. Cerio research?
Frank M. Cerio's work is mostly in Engineering (41%), Materials Science (26%), Medicine (5%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1966.3%
- Engineering1240.7%
- Materials Science725.6%
- Everything else829.0%
- Health Sciences14.7%
- Medicine14.7%
- 1Electrical and Electronic Engineering26% of their works
- 2Materials Chemistry14% of their works
- 3Electronic, Optical and Magnetic Materials12% of their works
- 4Mechanics of Materials9% of their works
- 5Computational Mechanics6% of their works
- 6Radiology, Nuclear Medicine and Imaging5% of their works
Research topics
- Semiconductor materials and devices
- Copper Interconnects and Reliability
- Metal and Thin Film Mechanics
- Diamond and Carbon-based Materials Research
- Ion-surface interactions and analysis
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- GaN-based semiconductor devices and materials
Which keywords describe Frank M. Cerio's research?
The keywords of their largest research topics: Thin Films, Nanowires, Atomic Layer Deposition, High-k Dielectrics, X-ray Photoelectron Spectroscopy, Low-k Dielectrics, Microelectronics and Coatings.
- Scanning Electron Microscopy
- III-Nitrides
- Electron Beam Lithography
- Ion Beam
- Nanoindentation
- Coatings
- Low-k Dielectrics
- High-k Dielectrics
- Nanowires
- Thin Films
- Atomic Layer Deposition
- X-ray Photoelectron Spectroscopy
- Microelectronics
- Nanodiamonds
- Quantum Sensing
- Surface Analysis
- Electron Inelastic Mean Free Paths
- Nanofabrication
- Semiconductors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Thin Films172 topics
- Nanowires122 topics
- Atomic Layer Deposition111 topic
- High-k Dielectrics111 topic
- X-ray Photoelectron Spectroscopy112 topics
- Low-k Dielectrics91 topic
- Microelectronics91 topic
- Coatings81 topic
- Nanodiamonds81 topic
- Nanoindentation81 topic
- Quantum Sensing81 topic
- Ion Beam41 topic
- Surface Analysis41 topic
- Electron Beam Lithography31 topic
- Electron Inelastic Mean Free Paths31 topic
- III-Nitrides31 topic
- Nanofabrication31 topic
- Scanning Electron Microscopy31 topic
- Semiconductors31 topic
Where does Frank M. Cerio work?
Frank M. Cerio's main affiliation in the publication record is Veeco (United States), United States.
How many publications and citations does Frank M. Cerio have?
OpenAlex counts 29 works and 351 citations for Frank M. Cerio, an h-index of 10, ranking #5,011,999 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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