Frank Zachariasse
Frank Zachariasse publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Advanced Surface Polishing Techniques and Near-Field Optical Microscopy.
- World rank
- #6,296,866 of 7,710,434 ranked researchers
- Rank in Netherlands
- #100,721 of 107,149
- Works
- 15
- Citations
- 53
- Citations per work
- 3.5
What does Frank Zachariasse research?
Frank Zachariasse's work is mostly in Engineering (64%), Computer Science (8%), Materials Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1387.2%
- Engineering1064.1%
- Computer Science17.7%
- Materials Science17.7%
- Physics and Astronomy17.7%
- Everything else17.7%
- Health Sciences15.1%
- Medicine15.1%
- 1Electrical and Electronic Engineering41% of their works
- 2Biomedical Engineering23% of their works
- 3Surfaces, Coatings and Films8% of their works
- 4Atomic and Molecular Physics, and Optics8% of their works
- 5Hardware and Architecture8% of their works
- 6Radiology, Nuclear Medicine and Imaging5% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Near-Field Optical Microscopy
- Force Microscopy Techniques and Applications
- VLSI and Analog Circuit Testing
- Semiconductor materials and devices
- Electron and X-Ray Spectroscopy Techniques
- Advanced MRI Techniques and Applications
Which keywords describe Frank Zachariasse's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Chemical Mechanical Planarization, Material Removal Mechanism, Near-Field Optical Microscopy, Photonic Nanojets, Atomic Force Microscopy and Force Spectroscopy.
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Magnetic Resonance Imaging
- Embedded Cores
- Force Spectroscopy
- Photonic Nanojets
- Material Removal Mechanism
- Integrated Circuits
- Failure Analysis
- Chemical Mechanical Planarization
- Near-Field Optical Microscopy
- Atomic Force Microscopy
- Atomic Layer Deposition
- High-k Dielectrics
- Perfusion Imaging
- Test Data Compression
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Failure Analysis111 topic
- Integrated Circuits111 topic
- Chemical Mechanical Planarization41 topic
- Material Removal Mechanism41 topic
- Near-Field Optical Microscopy41 topic
- Photonic Nanojets41 topic
- Atomic Force Microscopy31 topic
- Force Spectroscopy31 topic
- Atomic Layer Deposition21 topic
- Embedded Cores21 topic
- High-k Dielectrics21 topic
- Magnetic Resonance Imaging21 topic
- Perfusion Imaging21 topic
- Scanning Electron Microscopy21 topic
- Test Data Compression21 topic
- X-ray Photoelectron Spectroscopy21 topic
Where does Frank Zachariasse work?
Frank Zachariasse's main affiliation in the publication record is NXP (Netherlands), Netherlands.
How many publications and citations does Frank Zachariasse have?
OpenAlex counts 15 works and 53 citations for Frank Zachariasse, an h-index of 4, ranking #6,296,866 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
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