Gerd Scheuring
Gerd Scheuring publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Mechanical Engineering, on topics such as Advancements in Photolithography Techniques, Surface Roughness and Optical Measurements and Advanced Measurement and Metrology Techniques.
- World rank
- #7,093,093 of 7,710,434 ranked researchers
- Rank in Germany
- #346,194 of 364,343
- Works
- 20
- Citations
- 50
- Citations per work
- 2.5
What does Gerd Scheuring research?
Gerd Scheuring's work is mostly in Engineering (79%), Materials Science (19%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2098.2%
- Engineering1678.9%
- Materials Science419.3%
- 1Electrical and Electronic Engineering42% of their works
- 2Surfaces, Coatings and Films19% of their works
- 3Mechanical Engineering14% of their works
- 4Computational Mechanics12% of their works
- 5Biomedical Engineering7% of their works
- 6Industrial and Manufacturing Engineering4% of their works
Research topics
- Advancements in Photolithography Techniques
- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Surface Polishing Techniques
- Industrial Vision Systems and Defect Detection
Which keywords describe Gerd Scheuring's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Machine Vision, Dimensional Metrology, Error Compensation, Roughness Measurement and Surface Characterization.
- Texture Analysis
- Fabric Defect Detection
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Nanostructures
- Surface Characterization
- Error Compensation
- Machine Vision
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- Dimensional Metrology
- Roughness Measurement
- Antireflective Coatings
- Scanning Electron Microscopy
- Failure Analysis
- Chemical Mechanical Planarization
- Material Removal Mechanism
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Nanofabrication252 topics
- Electron Beam Lithography191 topic
- Resolution Limits191 topic
- Machine Vision92 topics
- Dimensional Metrology71 topic
- Error Compensation71 topic
- Roughness Measurement71 topic
- Surface Characterization71 topic
- Antireflective Coatings61 topic
- Nanostructures61 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Failure Analysis31 topic
- Integrated Circuits31 topic
- Chemical Mechanical Planarization21 topic
- Fabric Defect Detection21 topic
- Material Removal Mechanism21 topic
- Texture Analysis21 topic
Where does Gerd Scheuring work?
Gerd Scheuring's main affiliation in the publication record is Infineon Technologies (Germany), Germany.
How many publications and citations does Gerd Scheuring have?
OpenAlex counts 20 works and 50 citations for Gerd Scheuring, an h-index of 4, ranking #7,093,093 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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