Herschel M. Marchman
Herschel M. Marchman publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Force Microscopy Techniques and Applications.
- World rank
- #7,107,501 of 7,710,434 ranked researchers
- Rank in United States
- #1,583,773 of 1,627,098
- Works
- 44
- Citations
- 936
- Citations per work
- 21.3
What does Herschel M. Marchman research?
Herschel M. Marchman's work is mostly in Engineering (60%), Physics and Astronomy (18%), Materials Science (14%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4092.0%
- Engineering2660.0%
- Physics and Astronomy817.6%
- Materials Science614.4%
- Everything else48.0%
- 1Electrical and Electronic Engineering34% of their works
- 2Atomic and Molecular Physics, and Optics18% of their works
- 3Surfaces, Coatings and Films14% of their works
- 4Computational Mechanics10% of their works
- 5Biomedical Engineering9% of their works
- 6Mechanical Engineering7% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Force Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
- Surface and Thin Film Phenomena
- Near-Field Optical Microscopy
Which keywords describe Herschel M. Marchman's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Atomic Force Microscopy, Force Spectroscopy, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.
- Photonic Nanojets
- Superconductivity
- Error Compensation
- Surface Characterization
- X-ray Photoelectron Spectroscopy
- Force Spectroscopy
- Integrated Circuits
- Nanofabrication
- Electron Beam Lithography
- Failure Analysis
- Atomic Force Microscopy
- Scanning Electron Microscopy
- Roughness Measurement
- Dimensional Metrology
- Quantum Size Effects
- Near-Field Optical Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Electron Beam Lithography221 topic
- Nanofabrication221 topic
- Failure Analysis151 topic
- Integrated Circuits151 topic
- Atomic Force Microscopy141 topic
- Force Spectroscopy141 topic
- Scanning Electron Microscopy131 topic
- X-ray Photoelectron Spectroscopy131 topic
- Roughness Measurement101 topic
- Surface Characterization101 topic
- Dimensional Metrology81 topic
- Error Compensation81 topic
- Quantum Size Effects81 topic
- Superconductivity81 topic
- Near-Field Optical Microscopy61 topic
- Photonic Nanojets61 topic
Where does Herschel M. Marchman work?
Herschel M. Marchman's main affiliation in the publication record is AT&T (United States), United States.
How many publications and citations does Herschel M. Marchman have?
OpenAlex counts 44 works and 936 citations for Herschel M. Marchman, an h-index of 9, ranking #7,107,501 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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