J.-L. Ogier
J.-L. Ogier publishes mostly in Electrical and Electronic Engineering, Materials Chemistry and Hardware and Architecture, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #4,075,036 of 7,710,434 ranked researchers
- Rank in France
- #171,498 of 324,115
- Works
- 40
- Citations
- 1.1k
- Citations per work
- 27.9
What does J.-L. Ogier research?
J.-L. Ogier's work is mostly in Engineering (79%), Materials Science (12%), Computer Science (6%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3996.6%
- Engineering3279.1%
- Materials Science511.7%
- Computer Science25.8%
- Everything else13.4%
- 1Electrical and Electronic Engineering78% of their works
- 2Materials Chemistry9% of their works
- 3Hardware and Architecture3% of their works
- 4Computer Networks and Communications2% of their works
- 5Electronic, Optical and Magnetic Materials2% of their works
- 6Control and Systems Engineering1% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic and Structural Properties of Oxides
- Advanced Memory and Neural Computing
- Ferroelectric and Negative Capacitance Devices
- Advanced Data Storage Technologies
- VLSI and Analog Circuit Testing
Which keywords describe J.-L. Ogier's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Neuromorphic Computing, Failure Analysis, Integrated Circuits and Oxide Interfaces.
- Network Coding
- Distributed Storage
- Ferroelectricity
- Memristor
- Oxide Interfaces
- Failure Analysis
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- Atomic Layer Deposition
- Nanowire Transistors
- Neuromorphic Computing
- Integrated Circuits
- Two-Dimensional Electron Gases
- Resistive Switching
- Hafnium Oxide
- Embedded Cores
- Test Data Compression
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Atomic Layer Deposition371 topic
- High-k Dielectrics371 topic
- Nanowire Transistors241 topic
- Tunnel Field-Effect Transistors241 topic
- Neuromorphic Computing132 topics
- Failure Analysis111 topic
- Integrated Circuits111 topic
- Oxide Interfaces81 topic
- Two-Dimensional Electron Gases81 topic
- Memristor71 topic
- Resistive Switching71 topic
- Ferroelectricity61 topic
- Hafnium Oxide61 topic
- Distributed Storage31 topic
- Embedded Cores31 topic
- Network Coding31 topic
- Test Data Compression31 topic
Where does J.-L. Ogier work?
J.-L. Ogier's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does J.-L. Ogier have?
OpenAlex counts 40 works and 1,116 citations for J.-L. Ogier, an h-index of 10, ranking #4,075,036 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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