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Researcher · Hannoversche Informationstechnologien (Germany) · Germany

J. Otterstedt

J. Otterstedt publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Semiconductor materials and devices.

OpenAlex
World rank
#3,534,302
of 7,710,434 ranked researchers
Rank in Germany
#176,665
of 364,343
Works
21
Citations
364
Citations per work
17.3
h-index
9
i10-index 9Top 59% in Electrical and Electronic Engineering
J. Otterstedt

What does J. Otterstedt research?

J. Otterstedt's work is mostly in Engineering (57%), Computer Science (24%), Neuroscience (3%).

Physical Sciences: 18 works · 84.2% of their workEngineering: 12 works · 57.1% of their workElectrical and Electronic Engineering: 12 works · 57.1% of their workComputer Science: 5 works · 23.9% of their workHardware and Architecture: 3 works · 14.3% of their workComputer Networks and Communications: 1 works · 4.8% of their workSignal Processing: 1 works · 4.8% of their workMaterials Science: 1 works · 3.2% of their workElectronic, Optical and Magnetic Materials: 1 works · 3.2% of their workEverything else: 3 works · 12.6% of their workLife Sciences: 1 works · 3.2% of their workNeuroscience: 1 works · 3.2% of their workCellular and Molecular Neuroscience: 1 works · 3.2% of their workTHEIR WORKJ. Otterstedt21works
Life Sciences3%Physical Sciences84%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1257.1%
    2. Computer Science523.9%
    3. Materials Science13.2%
  2. Everything else312.6%
    1. Neuroscience13.2%
  1. 1Electrical and Electronic Engineering57% of their works
  2. 2Hardware and Architecture14% of their works
  3. 3Computer Networks and Communications5% of their works
  4. 4Signal Processing5% of their works
  5. 5Cellular and Molecular Neuroscience3% of their works
  6. 6Electronic, Optical and Magnetic Materials3% of their works

Research topics

Which keywords describe J. Otterstedt's research?

The keywords of their largest research topics: Nanoelectronics, Embedded Cores, Failure Analysis, Fault Tolerance, Integrated Circuits, Test Data Compression, Atomic Layer Deposition and High-k Dielectrics.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.

All 18 words, with their numbers
  1. Nanoelectronics102 topics
  2. Embedded Cores81 topic
  3. Failure Analysis81 topic
  4. Fault Tolerance82 topics
  5. Integrated Circuits81 topic
  6. Test Data Compression81 topic
  7. Atomic Layer Deposition51 topic
  8. High-k Dielectrics51 topic
  9. Memristor51 topic
  10. Neuromorphic Computing51 topic
  11. Radiation Effects51 topic
  12. Soft Errors51 topic
  13. H.264/AVC31 topic
  14. Interconnection Networks31 topic
  15. Networks on Chip31 topic
  16. Silicon31 topic
  17. Solar Cells31 topic
  18. Video Coding31 topic

Where does J. Otterstedt work?

J. Otterstedt's main affiliation in the publication record is Hannoversche Informationstechnologien (Germany), Germany.

How many publications and citations does J. Otterstedt have?

OpenAlex counts 21 works and 364 citations for J. Otterstedt, an h-index of 9, ranking #3,534,302 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

Discussion

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