J.R. Schwank
J.R. Schwank publishes mostly in Electrical and Electronic Engineering, Materials Chemistry and Hardware and Architecture, on topics such as Semiconductor materials and devices, Radiation Effects in Electronics and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #46,440 of 7,710,434 ranked researchers
- Rank in United States
- #17,907 of 1,627,098
- Works
- 192
- Citations
- 11k
- Citations per work
- 57.2
What does J.R. Schwank research?
J.R. Schwank's work is mostly in Engineering (85%), Materials Science (4%), Computer Science (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences18093.7%
- Engineering16384.7%
- Materials Science94.5%
- Computer Science52.6%
- Physics and Astronomy41.9%
- Everything else126.3%
- 1Electrical and Electronic Engineering84% of their works
- 2Materials Chemistry4% of their works
- 3Hardware and Architecture3% of their works
- 4Atomic and Molecular Physics, and Optics1% of their works
- 5Biomedical Engineering1% of their works
- 6Radiation1% of their works
Research topics
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
- VLSI and Analog Circuit Testing
- Silicon and Solar Cell Technologies
- Electronic and Structural Properties of Oxides
Which keywords describe J.R. Schwank's research?
The keywords of their largest research topics: Nanoelectronics, Atomic Layer Deposition, High-k Dielectrics, Radiation Effects, Soft Errors, Failure Analysis, Integrated Circuits and Nanowire Transistors.
- Solar Cells
- Oxide Interfaces
- Embedded Cores
- Memristor
- Nanowire Transistors
- Failure Analysis
- Radiation Effects
- Atomic Layer Deposition
- Nanoelectronics
- High-k Dielectrics
- Soft Errors
- Integrated Circuits
- Tunnel Field-Effect Transistors
- Neuromorphic Computing
- Test Data Compression
- Silicon
- Two-Dimensional Electron Gases
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Nanoelectronics2502 topics
- Atomic Layer Deposition1561 topic
- High-k Dielectrics1561 topic
- Radiation Effects941 topic
- Soft Errors941 topic
- Failure Analysis821 topic
- Integrated Circuits821 topic
- Nanowire Transistors771 topic
- Tunnel Field-Effect Transistors771 topic
- Memristor261 topic
- Neuromorphic Computing261 topic
- Embedded Cores141 topic
- Test Data Compression141 topic
- Oxide Interfaces91 topic
- Silicon91 topic
- Solar Cells91 topic
- Two-Dimensional Electron Gases91 topic
Where does J.R. Schwank work?
J.R. Schwank's main affiliation in the publication record is Sandia National Laboratories, United States.
How many publications and citations does J.R. Schwank have?
OpenAlex counts 192 works and 10,984 citations for J.R. Schwank, an h-index of 58, ranking #46,440 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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