J.R. Schwank
J.R. Schwank publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Materials Chemistry, on topics such as Semiconductor materials and devices, Radiation Effects in Electronics and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #25,571 of 1,633,909 ranked researchers
- Rank in United States
- #11,980 of 358,040
- Works
- 50
- Citations
- 628
- Citations per work
- 12.6
What does J.R. Schwank research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering88% of their works
- 2Hardware and Architecture5% of their works
- 3Materials Chemistry4% of their works
- 4Safety, Risk, Reliability and Quality1% of their works
- 5Radiation1% of their works
Research topics
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- VLSI and Analog Circuit Testing
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics
- Silicon and Solar Cell Technologies
Which keywords describe J.R. Schwank's research?
The keywords of their largest research topics: Nanoelectronics, Atomic Layer Deposition, High-k Dielectrics, CMOS Technology, Radiation Effects, Soft Errors, Failure Analysis and Integrated Circuits.
- Solar Cells
- SCR Devices
- Test Data Compression
- Memristor
- Tunnel Field-Effect Transistors
- Integrated Circuits
- Soft Errors
- CMOS Technology
- Atomic Layer Deposition
- Nanoelectronics
- High-k Dielectrics
- Radiation Effects
- Failure Analysis
- Nanowire Transistors
- Embedded Cores
- Neuromorphic Computing
- ESD Protection
- Silicon
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Nanoelectronics412 topics
- Atomic Layer Deposition221 topic
- High-k Dielectrics221 topic
- CMOS Technology202 topics
- Radiation Effects191 topic
- Soft Errors191 topic
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Nanowire Transistors71 topic
- Tunnel Field-Effect Transistors71 topic
- Embedded Cores41 topic
- Memristor41 topic
- Neuromorphic Computing41 topic
- Test Data Compression41 topic
- ESD Protection11 topic
- SCR Devices11 topic
- Silicon11 topic
- Solar Cells11 topic
Where does J.R. Schwank work?
J.R. Schwank's main affiliation in the publication record is Sandia National Laboratories, United States.
How many publications and citations does J.R. Schwank have?
Science Explorer counts 50 works and 628 citations for J.R. Schwank, ranking #25,571 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.