James C. Pickel
James C. Pickel publishes mostly in Electrical and Electronic Engineering, Aerospace Engineering and Radiation, on topics such as Radiation Effects in Electronics, CCD and CMOS Imaging Sensors and Semiconductor materials and devices.
- World rank
- #773,076 of 7,710,434 ranked researchers
- Rank in United States
- #258,884 of 1,627,098
- Works
- 41
- Citations
- 1.5k
- Citations per work
- 37.0
What does James C. Pickel research?
James C. Pickel's work is mostly in Engineering (70%), Physics and Astronomy (11%), Computer Science (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3484.1%
- Engineering2970.0%
- Physics and Astronomy410.8%
- Computer Science13.3%
- Everything else512.6%
- Health Sciences13.3%
- Medicine13.3%
- 1Electrical and Electronic Engineering63% of their works
- 2Aerospace Engineering7% of their works
- 3Radiation6% of their works
- 4Nuclear and High Energy Physics5% of their works
- 5Pulmonary and Respiratory Medicine3% of their works
- 6Hardware and Architecture3% of their works
Research topics
- Radiation Effects in Electronics
- CCD and CMOS Imaging Sensors
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Semiconductor Detectors and Materials
- Radiation Detection and Scintillator Technologies
- Particle Detector Development and Performance
- Infrared Target Detection Methodologies
Which keywords describe James C. Pickel's research?
The keywords of their largest research topics: Radiation Effects, Nanoelectronics, CMOS Technology, Error Detection, Soft Errors, Photon Counting, Radiation Detection and Detector Performance.
- Small Target
- Silicon Detectors
- Semiconductor Materials
- Inorganic Scintillators
- Integrated Circuits
- Failure Analysis
- High-Speed Imaging
- Detector Performance
- Photon Counting
- Error Detection
- Nanoelectronics
- Radiation Effects
- CMOS Technology
- Soft Errors
- Radiation Detection
- CMOS Image Sensors
- Atomic Layer Deposition
- High-k Dielectrics
- Infrared Detectors
- Scintillation Detectors
- Particle Detectors
- Infrared
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 22 words, with their numbers
- Radiation Effects372 topics
- Nanoelectronics362 topics
- CMOS Technology322 topics
- Error Detection261 topic
- Soft Errors261 topic
- Photon Counting172 topics
- Radiation Detection142 topics
- Detector Performance132 topics
- CMOS Image Sensors111 topic
- High-Speed Imaging111 topic
- Atomic Layer Deposition101 topic
- Failure Analysis101 topic
- High-k Dielectrics101 topic
- Integrated Circuits101 topic
- Infrared Detectors71 topic
- Inorganic Scintillators71 topic
- Scintillation Detectors71 topic
- Semiconductor Materials71 topic
- Particle Detectors61 topic
- Silicon Detectors61 topic
- Infrared51 topic
- Small Target51 topic
Where does James C. Pickel work?
James C. Pickel's main affiliation in the publication record is Rockwell Automation (United States), United States.
How many publications and citations does James C. Pickel have?
OpenAlex counts 41 works and 1,518 citations for James C. Pickel, an h-index of 18, ranking #773,076 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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