Jan Baselmans
Jan Baselmans publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Industrial and Manufacturing Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.
- World rank
- #6,202,059 of 7,710,434 ranked researchers
- Rank in Netherlands
- #100,074 of 107,149
- Works
- 20
- Citations
- 225
- Citations per work
- 11.3
What does Jan Baselmans research?
Jan Baselmans's work is mostly in Engineering (76%), Materials Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1783.1%
- Engineering1576.3%
- Materials Science16.8%
- Everything else316.9%
- 1Electrical and Electronic Engineering42% of their works
- 2Biomedical Engineering17% of their works
- 3Industrial and Manufacturing Engineering7% of their works
- 4Surfaces, Coatings and Films7% of their works
- 5Computational Mechanics7% of their works
- 6Media Technology3% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Industrial Vision Systems and Defect Detection
- Nanofabrication and Lithography Techniques
- Surface Roughness and Optical Measurements
- Optical Coatings and Gratings
- Advanced Surface Polishing Techniques
- Photoacoustic and Ultrasonic Imaging
Which keywords describe Jan Baselmans's research?
The keywords of their largest research topics: High-Resolution Patterning, Nanofabrication, Electron Beam Lithography, Resolution Limits, Failure Analysis, Integrated Circuits, Machine Vision and Fabric Defect Detection.
- Photoacoustic Imaging
- Chemical Mechanical Planarization
- Soft Lithography
- Nanostructures
- Antireflective Coatings
- Fabric Defect Detection
- Integrated Circuits
- Resolution Limits
- Nanofabrication
- High-Resolution Patterning
- Electron Beam Lithography
- Failure Analysis
- Machine Vision
- Texture Analysis
- Nanolithography
- Roughness Measurement
- Surface Characterization
- Material Removal Mechanism
- Tomography
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 19 words, with their numbers
- High-Resolution Patterning192 topics
- Nanofabrication192 topics
- Electron Beam Lithography161 topic
- Resolution Limits161 topic
- Failure Analysis71 topic
- Integrated Circuits71 topic
- Machine Vision72 topics
- Fabric Defect Detection41 topic
- Texture Analysis41 topic
- Antireflective Coatings31 topic
- Nanolithography31 topic
- Nanostructures31 topic
- Roughness Measurement31 topic
- Soft Lithography31 topic
- Surface Characterization31 topic
- Chemical Mechanical Planarization21 topic
- Material Removal Mechanism21 topic
- Photoacoustic Imaging21 topic
- Tomography21 topic
Where does Jan Baselmans work?
Jan Baselmans's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Jan Baselmans have?
OpenAlex counts 20 works and 225 citations for Jan Baselmans, an h-index of 7, ranking #6,202,059 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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