Jan O. Gaudestad
Jan O. Gaudestad publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Computer Vision and Pattern Recognition, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Optical measurement and interference techniques and Advanced Surface Polishing Techniques.
- World rank
- #7,645,501 of 7,710,434 ranked researchers
- Rank in United States
- #1,621,858 of 1,627,098
- Works
- 59
- Citations
- 233
- Citations per work
- 3.9
What does Jan O. Gaudestad research?
Jan O. Gaudestad's work is mostly in Engineering (63%), Computer Science (12%), Materials Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4982.4%
- Engineering3763.2%
- Computer Science712.4%
- Materials Science46.8%
- Everything else1017.6%
- 1Electrical and Electronic Engineering32% of their works
- 2Biomedical Engineering19% of their works
- 3Computer Vision and Pattern Recognition12% of their works
- 4Surfaces, Coatings and Films7% of their works
- 5Mechanical Engineering6% of their works
- 6Industrial and Manufacturing Engineering6% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Optical measurement and interference techniques
- Advanced Surface Polishing Techniques
- Near-Field Optical Microscopy
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Advanced Measurement and Metrology Techniques
- Electron and X-Ray Spectroscopy Techniques
Which keywords describe Jan O. Gaudestad's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Camera Calibration, Structured Light, Chemical Mechanical Planarization, Material Removal Mechanism, Near-Field Optical Microscopy and Photonic Nanojets.
- X-ray Photoelectron Spectroscopy
- Error Compensation
- Machine Vision
- Nanofabrication
- Photonic Nanojets
- Material Removal Mechanism
- Structured Light
- Integrated Circuits
- Failure Analysis
- Camera Calibration
- Chemical Mechanical Planarization
- Near-Field Optical Microscopy
- Electron Beam Lithography
- Fabric Defect Detection
- Dimensional Metrology
- Scanning Electron Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Failure Analysis381 topic
- Integrated Circuits381 topic
- Camera Calibration201 topic
- Structured Light201 topic
- Chemical Mechanical Planarization191 topic
- Material Removal Mechanism191 topic
- Near-Field Optical Microscopy151 topic
- Photonic Nanojets151 topic
- Electron Beam Lithography131 topic
- Nanofabrication131 topic
- Fabric Defect Detection101 topic
- Machine Vision101 topic
- Dimensional Metrology81 topic
- Error Compensation81 topic
- Scanning Electron Microscopy81 topic
- X-ray Photoelectron Spectroscopy81 topic
Where does Jan O. Gaudestad work?
Jan O. Gaudestad's main affiliation in the publication record is Neocera (United States), United States.
How many publications and citations does Jan O. Gaudestad have?
OpenAlex counts 59 works and 233 citations for Jan O. Gaudestad, an h-index of 8, ranking #7,645,501 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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