Jay F. Marchiando
Jay F. Marchiando publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Force Microscopy Techniques and Applications and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #7,264,944 of 7,710,434 ranked researchers
- Rank in United States
- #1,596,429 of 1,627,098
- Works
- 52
- Citations
- 477
- Citations per work
- 9.2
What does Jay F. Marchiando research?
Jay F. Marchiando's work is mostly in Engineering (45%), Physics and Astronomy (22%), Materials Science (14%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4484.0%
- Engineering2344.8%
- Physics and Astronomy1222.4%
- Materials Science714.0%
- Mathematics12.8%
- Everything else816.0%
- 1Electrical and Electronic Engineering36% of their works
- 2Atomic and Molecular Physics, and Optics22% of their works
- 3Surfaces, Coatings and Films14% of their works
- 4Computational Mechanics5% of their works
- 5Biomedical Engineering4% of their works
- 6Numerical Analysis3% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Force Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
- Advancements in Photolithography Techniques
- Optical Coatings and Gratings
- Semiconductor materials and interfaces
Which keywords describe Jay F. Marchiando's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Atomic Force Microscopy, Force Spectroscopy, Scanning Electron Microscopy, Solar Cells, X-ray Photoelectron Spectroscopy and Nanofabrication.
- Silicon
- Resolution Limits
- Metal-Semiconductor Contacts
- Efficiency
- High-k Dielectrics
- Nanofabrication
- Solar Cells
- Force Spectroscopy
- Integrated Circuits
- Failure Analysis
- Atomic Force Microscopy
- Scanning Electron Microscopy
- X-ray Photoelectron Spectroscopy
- Atomic Layer Deposition
- Antireflective Coatings
- Electron Beam Lithography
- Nanostructures
- Schottky Barrier
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Failure Analysis231 topic
- Integrated Circuits231 topic
- Atomic Force Microscopy201 topic
- Force Spectroscopy201 topic
- Scanning Electron Microscopy151 topic
- Solar Cells153 topics
- X-ray Photoelectron Spectroscopy151 topic
- Nanofabrication102 topics
- Atomic Layer Deposition91 topic
- High-k Dielectrics91 topic
- Antireflective Coatings51 topic
- Efficiency51 topic
- Electron Beam Lithography51 topic
- Metal-Semiconductor Contacts51 topic
- Nanostructures51 topic
- Resolution Limits51 topic
- Schottky Barrier51 topic
- Silicon51 topic
Where does Jay F. Marchiando work?
Jay F. Marchiando's main affiliation in the publication record is National Institute of Standards and Technology, United States.
How many publications and citations does Jay F. Marchiando have?
OpenAlex counts 52 works and 477 citations for Jay F. Marchiando, an h-index of 12, ranking #7,264,944 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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