Jeffrey Lam
Jeffrey Lam publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Computational Mechanics, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices and Ion-surface interactions and analysis.
- World rank
- #1,507,677 of 1,633,909 ranked researchers
- Rank in Singapore
- #4,768 of 5,048
- Works
- 27
- Citations
- 14
- Citations per work
- 0.5
What does Jeffrey Lam research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering45% of their works
- 2Biomedical Engineering12% of their works
- 3Computational Mechanics10% of their works
- 4Electronic, Optical and Magnetic Materials7% of their works
- 5Atomic and Molecular Physics, and Optics5% of their works
- 6Control and Systems Engineering5% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Ion-surface interactions and analysis
- Advanced Surface Polishing Techniques
- Copper Interconnects and Reliability
- Force Microscopy Techniques and Applications
- Advanced Electron Microscopy Techniques and Applications
- VLSI and Analog Circuit Testing
Which keywords describe Jeffrey Lam's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Atomic Layer Deposition, High-k Dielectrics, Ion Beam, Surface Analysis, Chemical Mechanical Planarization and Low-k Dielectrics.
- Test Data Compression
- Embedded Cores
- Force Spectroscopy
- Microelectronics
- Low-k Dielectrics
- Surface Analysis
- High-k Dielectrics
- Integrated Circuits
- Failure Analysis
- Atomic Layer Deposition
- Ion Beam
- Chemical Mechanical Planarization
- Material Removal Mechanism
- Atomic Force Microscopy
- Cryo-Electron Microscopy
- Single-Particle Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Failure Analysis111 topic
- Integrated Circuits111 topic
- Atomic Layer Deposition71 topic
- High-k Dielectrics71 topic
- Ion Beam41 topic
- Surface Analysis41 topic
- Chemical Mechanical Planarization31 topic
- Low-k Dielectrics31 topic
- Material Removal Mechanism31 topic
- Microelectronics31 topic
- Atomic Force Microscopy21 topic
- Force Spectroscopy21 topic
- Cryo-Electron Microscopy11 topic
- Embedded Cores11 topic
- Single-Particle Analysis11 topic
- Test Data Compression11 topic
Where does Jeffrey Lam work?
Jeffrey Lam's main affiliation in the publication record is GlobalFoundries (Singapore), Singapore.
How many publications and citations does Jeffrey Lam have?
Science Explorer counts 27 works and 14 citations for Jeffrey Lam, ranking #1,507,677 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.