L.V. Kirkland
L.V. Kirkland publishes mostly in Control and Systems Engineering, Hardware and Architecture and Electrical and Electronic Engineering, on topics such as Engineering and Test Systems, VLSI and Analog Circuit Testing and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #1,216,362 of 1,633,909 ranked researchers
- Rank in United States
- #298,260 of 358,040
- Works
- 32
- Citations
- 13
- Citations per work
- 0.4
What does L.V. Kirkland research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Control and Systems Engineering32% of their works
- 2Hardware and Architecture29% of their works
- 3Electrical and Electronic Engineering24% of their works
- 4Computer Networks and Communications5% of their works
- 5Software5% of their works
- 6Biomedical Engineering3% of their works
Research topics
- Engineering and Test Systems
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Neural Networks and Applications
- Sensor Technology and Measurement Systems
- Software System Performance and Reliability
- Embedded Systems Design Techniques
- Software Testing and Debugging Techniques
Which keywords describe L.V. Kirkland's research?
The keywords of their largest research topics: Fault Diagnosis, Sequential Testing Algorithms, Embedded Cores, Test Data Compression, Fault Localization, Failure Analysis, Integrated Circuits and Artificial Neural Networks.
- Smart Sensors
- Reconfigurable Computing
- Log Analysis
- High-Level Synthesis
- Automated Testing
- Artificial Neural Networks
- Failure Analysis
- Test Data Compression
- Sequential Testing Algorithms
- Fault Diagnosis
- Embedded Cores
- Fault Localization
- Integrated Circuits
- Neural Networks
- Backpropagation Learning
- IEEE 1451
- Performance Prediction
- Self-Organizing Maps
- Software Fault Localization
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Fault Diagnosis111 topic
- Sequential Testing Algorithms111 topic
- Embedded Cores101 topic
- Test Data Compression101 topic
- Fault Localization92 topics
- Failure Analysis81 topic
- Integrated Circuits81 topic
- Artificial Neural Networks22 topics
- Neural Networks22 topics
- Automated Testing11 topic
- Backpropagation Learning11 topic
- High-Level Synthesis11 topic
- IEEE 145111 topic
- Log Analysis11 topic
- Performance Prediction11 topic
- Reconfigurable Computing11 topic
- Self-Organizing Maps11 topic
- Smart Sensors11 topic
- Software Fault Localization11 topic
Where does L.V. Kirkland work?
L.V. Kirkland's main affiliation in the publication record is WesTest Engineering (United States), United States.
How many publications and citations does L.V. Kirkland have?
Science Explorer counts 32 works and 13 citations for L.V. Kirkland, ranking #1,216,362 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.