Lowell P. Howard
Lowell P. Howard publishes mostly in Mechanical Engineering, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, on topics such as Advanced Measurement and Metrology Techniques, Force Microscopy Techniques and Applications and Optical Coatings and Gratings.
- World rank
- #5,627,566 of 7,710,434 ranked researchers
- Rank in United States
- #1,406,448 of 1,627,098
- Works
- 44
- Citations
- 370
- Citations per work
- 8.4
What does Lowell P. Howard research?
Lowell P. Howard's work is mostly in Engineering (48%), Physics and Astronomy (15%), Materials Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3170.2%
- Engineering2147.6%
- Physics and Astronomy715.3%
- Materials Science37.3%
- Everything else1125.0%
- Social Sciences24.8%
- Decision Sciences24.8%
- 1Mechanical Engineering22% of their works
- 2Electrical and Electronic Engineering21% of their works
- 3Atomic and Molecular Physics, and Optics15% of their works
- 4Surfaces, Coatings and Films7% of their works
- 5Computational Mechanics5% of their works
- 6Statistics, Probability and Uncertainty5% of their works
Research topics
- Advanced Measurement and Metrology Techniques
- Force Microscopy Techniques and Applications
- Optical Coatings and Gratings
- Surface Roughness and Optical Measurements
- Advanced MEMS and NEMS Technologies
- Scientific Measurement and Uncertainty Evaluation
- Optical measurement and interference techniques
- Advancements in Photolithography Techniques
Which keywords describe Lowell P. Howard's research?
The keywords of their largest research topics: Dimensional Metrology, Error Compensation, Nanofabrication, Atomic Force Microscopy, Force Spectroscopy, Antireflective Coatings, Nanostructures and Measurement Uncertainty.
- Resolution Limits
- Camera Calibration
- Silicon
- Redefinition of SI Units
- MEMS
- Antireflective Coatings
- Atomic Force Microscopy
- Error Compensation
- Dimensional Metrology
- Nanofabrication
- Force Spectroscopy
- Nanostructures
- Measurement Uncertainty
- Roughness Measurement
- Surface Characterization
- Electron Beam Lithography
- Structured Light
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Dimensional Metrology241 topic
- Error Compensation241 topic
- Nanofabrication122 topics
- Atomic Force Microscopy91 topic
- Force Spectroscopy91 topic
- Antireflective Coatings71 topic
- Nanostructures71 topic
- MEMS61 topic
- Measurement Uncertainty61 topic
- Redefinition of SI Units61 topic
- Roughness Measurement61 topic
- Silicon61 topic
- Surface Characterization61 topic
- Camera Calibration51 topic
- Electron Beam Lithography51 topic
- Resolution Limits51 topic
- Structured Light51 topic
Where does Lowell P. Howard work?
Lowell P. Howard's main affiliation in the publication record is National Institute of Standards and Technology, United States.
How many publications and citations does Lowell P. Howard have?
OpenAlex counts 44 works and 370 citations for Lowell P. Howard, an h-index of 10, ranking #5,627,566 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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