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Researcher · Laboratoire d'Analyse et d'Architecture des Systèmes · France

M. Bafleur

M. Bafleur publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Mechanical Engineering, on topics such as Electrostatic Discharge in Electronics, Integrated Circuits and Semiconductor Failure Analysis and Electromagnetic Compatibility and Noise Suppression.

OpenAlex
World rank
#7,317,925
of 7,710,434 ranked researchers
Rank in France
#307,864
of 324,115
Works
26
Citations
173
Citations per work
6.7
h-index
7
i10-index 4Top 74% in Electrical and Electronic Engineering
M. Bafleur

What does M. Bafleur research?

M. Bafleur's work is mostly in Engineering (94%), Environmental Science (1%).

Physical Sciences: 25 works · 94.8% of their workEngineering: 24 works · 93.5% of their workElectrical and Electronic Engineering: 20 works · 75.0% of their workBiomedical Engineering: 2 works · 6.6% of their workAutomotive Engineering: 1 works · 5.3% of their workMechanical Engineering: 1 works · 5.3% of their workControl and Systems Engineering: 0 works · 1.3% of their workEnvironmental Science: 0 works · 1.3% of their workGlobal and Planetary Change: 0 works · 1.3% of their workEverything else: 1 works · 5.2% of their workTHEIR WORKM. Bafleur26works
Physical Sciences95%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering2493.5%
    2. Environmental Science01.3%
  2. Everything else15.2%
  1. 1Electrical and Electronic Engineering75% of their works
  2. 2Biomedical Engineering7% of their works
  3. 3Mechanical Engineering5% of their works
  4. 4Automotive Engineering5% of their works
  5. 5Global and Planetary Change1% of their works
  6. 6Control and Systems Engineering1% of their works

Research topics

Which keywords describe M. Bafleur's research?

The keywords of their largest research topics: CMOS Technology, ESD Protection, Electromagnetic Compatibility, EMI, Failure Analysis, Integrated Circuits, Thermal Management and Nanowire Transistors.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 17 words, with their numbers
  1. CMOS Technology161 topic
  2. ESD Protection161 topic
  3. EMI71 topic
  4. Electromagnetic Compatibility71 topic
  5. Failure Analysis71 topic
  6. Integrated Circuits71 topic
  7. Thermal Management72 topics
  8. Nanowire Transistors51 topic
  9. Tunnel Field-Effect Transistors51 topic
  10. Information Transfer41 topic
  11. Piezoelectric Materials41 topic
  12. Reliability41 topic
  13. Wide Bandgap Semiconductors41 topic
  14. Wireless Energy Harvesting41 topic
  15. Wireless Sensor Nodes41 topic
  16. Battery Management Systems31 topic
  17. Lithium-ion Batteries31 topic

Where does M. Bafleur work?

M. Bafleur's main affiliation in the publication record is Laboratoire d'Analyse et d'Architecture des Systèmes, France.

How many publications and citations does M. Bafleur have?

OpenAlex counts 26 works and 173 citations for M. Bafleur, an h-index of 7, ranking #7,317,925 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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