Marise Bafleur
Marise Bafleur publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Civil and Structural Engineering, on topics such as Electrostatic Discharge in Electronics, Integrated Circuits and Semiconductor Failure Analysis and Semiconductor materials and devices.
- World rank
- #724,647 of 1,633,909 ranked researchers
- Rank in France
- #44,694 of 96,116
- Works
- 57
- Citations
- 97
- Citations per work
- 1.7
What does Marise Bafleur research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering79% of their works
- 2Biomedical Engineering4% of their works
- 3Civil and Structural Engineering3% of their works
- 4Pollution3% of their works
- 5Mechanical Engineering3% of their works
- 6Renewable Energy, Sustainability and the Environment1% of their works
Research topics
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Energy Harvesting in Wireless Networks
- Radiation Effects in Electronics
Which keywords describe Marise Bafleur's research?
The keywords of their largest research topics: CMOS Technology, ESD Protection, SCR Devices, Nanoelectronics, Failure Analysis, Integrated Circuits, Atomic Layer Deposition and High-k Dielectrics.
- Soft Errors
- Wireless Energy Harvesting
- Wide Bandgap Semiconductors
- Reliability
- Electromagnetic Compatibility
- High-k Dielectrics
- Integrated Circuits
- Nanoelectronics
- ESD Protection
- CMOS Technology
- SCR Devices
- Failure Analysis
- Atomic Layer Deposition
- EMI
- Nanowire Transistors
- Tunnel Field-Effect Transistors
- Information Transfer
- Radiation Effects
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- CMOS Technology192 topics
- ESD Protection171 topic
- SCR Devices171 topic
- Nanoelectronics102 topics
- Failure Analysis91 topic
- Integrated Circuits91 topic
- Atomic Layer Deposition81 topic
- High-k Dielectrics81 topic
- EMI61 topic
- Electromagnetic Compatibility61 topic
- Nanowire Transistors41 topic
- Reliability41 topic
- Tunnel Field-Effect Transistors41 topic
- Wide Bandgap Semiconductors41 topic
- Information Transfer31 topic
- Wireless Energy Harvesting31 topic
- Radiation Effects21 topic
- Soft Errors21 topic
Where does Marise Bafleur work?
Marise Bafleur's main affiliation in the publication record is Laboratoire d'Analyse et d'Architecture des Systèmes, France.
How many publications and citations does Marise Bafleur have?
Science Explorer counts 57 works and 97 citations for Marise Bafleur, ranking #724,647 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.