Mehdi Vaez-Iravani
Mehdi Vaez-Iravani publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics, on topics such as Near-Field Optical Microscopy, Integrated Circuits and Semiconductor Failure Analysis and Force Microscopy Techniques and Applications.
- World rank
- #4,546,518 of 7,710,434 ranked researchers
- Rank in United States
- #1,206,791 of 1,627,098
- Works
- 27
- Citations
- 680
- Citations per work
- 25.2
What does Mehdi Vaez-Iravani research?
Mehdi Vaez-Iravani's work is mostly in Engineering (70%), Physics and Astronomy (19%), Biochemistry, Genetics and Molecular Biology (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2488.6%
- Engineering1969.6%
- Physics and Astronomy519.0%
- Everything else27.6%
- Life Sciences13.8%
- 1Electrical and Electronic Engineering38% of their works
- 2Biomedical Engineering25% of their works
- 3Atomic and Molecular Physics, and Optics19% of their works
- 4Biophysics4% of their works
- 5Computational Mechanics4% of their works
- 6Industrial and Manufacturing Engineering2% of their works
Research topics
- Near-Field Optical Microscopy
- Integrated Circuits and Semiconductor Failure Analysis
- Force Microscopy Techniques and Applications
- Advancements in Photolithography Techniques
- Advanced Surface Polishing Techniques
- Advanced Fluorescence Microscopy Techniques
- Surface Roughness and Optical Measurements
- Photonic and Optical Devices
Which keywords describe Mehdi Vaez-Iravani's research?
The keywords of their largest research topics: Super-Resolution Imaging, Integrated Circuits, Near-Field Optical Microscopy, Photonic Nanojets, Failure Analysis, Photon Emission Microscopy, Atomic Force Microscopy and Force Spectroscopy.
- Surface Characterization
- Roughness Measurement
- Single-Molecule Imaging
- Material Removal Mechanism
- Nanofabrication
- Force Spectroscopy
- Photon Emission Microscopy
- Photonic Nanojets
- Integrated Circuits
- Super-Resolution Imaging
- Near-Field Optical Microscopy
- Failure Analysis
- Atomic Force Microscopy
- Electron Beam Lithography
- Chemical Mechanical Planarization
- Fluorescent Proteins
- Optical Modulators
- Silicon Photonics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Super-Resolution Imaging182 topics
- Integrated Circuits162 topics
- Near-Field Optical Microscopy151 topic
- Photonic Nanojets151 topic
- Failure Analysis141 topic
- Photon Emission Microscopy141 topic
- Atomic Force Microscopy121 topic
- Force Spectroscopy121 topic
- Electron Beam Lithography51 topic
- Nanofabrication51 topic
- Chemical Mechanical Planarization41 topic
- Material Removal Mechanism41 topic
- Fluorescent Proteins31 topic
- Single-Molecule Imaging31 topic
- Optical Modulators21 topic
- Roughness Measurement21 topic
- Silicon Photonics21 topic
- Surface Characterization21 topic
Where does Mehdi Vaez-Iravani work?
Mehdi Vaez-Iravani's main affiliation in the publication record is Rochester Institute of Technology, United States.
How many publications and citations does Mehdi Vaez-Iravani have?
OpenAlex counts 27 works and 680 citations for Mehdi Vaez-Iravani, an h-index of 8, ranking #4,546,518 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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