Ndubuisi G. Orji
Ndubuisi G. Orji publishes mostly in Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering, on topics such as Force Microscopy Techniques and Applications, Advancements in Photolithography Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #7,059,924 of 7,710,434 ranked researchers
- Rank in United States
- #1,579,898 of 1,627,098
- Works
- 108
- Citations
- 1.4k
- Citations per work
- 12.8
What does Ndubuisi G. Orji research?
Ndubuisi G. Orji's work is mostly in Engineering (51%), Physics and Astronomy (25%), Materials Science (9%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences9184.3%
- Engineering5550.8%
- Physics and Astronomy2724.6%
- Materials Science108.9%
- Everything else1715.7%
- 1Atomic and Molecular Physics, and Optics25% of their works
- 2Electrical and Electronic Engineering24% of their works
- 3Biomedical Engineering15% of their works
- 4Surfaces, Coatings and Films9% of their works
- 5Mechanical Engineering7% of their works
- 6Computational Mechanics4% of their works
Research topics
- Force Microscopy Techniques and Applications
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Surface and Thin Film Phenomena
- Advanced Measurement and Metrology Techniques
- Advanced Surface Polishing Techniques
- Surface Roughness and Optical Measurements
Which keywords describe Ndubuisi G. Orji's research?
The keywords of their largest research topics: Atomic Force Microscopy, Force Spectroscopy, Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.
- Surface Characterization
- Material Removal Mechanism
- Error Compensation
- Superconductivity
- X-ray Photoelectron Spectroscopy
- Integrated Circuits
- Nanofabrication
- Force Spectroscopy
- Atomic Force Microscopy
- Electron Beam Lithography
- Failure Analysis
- Scanning Electron Microscopy
- Quantum Size Effects
- Dimensional Metrology
- Chemical Mechanical Planarization
- Roughness Measurement
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Atomic Force Microscopy521 topic
- Force Spectroscopy521 topic
- Electron Beam Lithography311 topic
- Nanofabrication311 topic
- Failure Analysis281 topic
- Integrated Circuits281 topic
- Scanning Electron Microscopy221 topic
- X-ray Photoelectron Spectroscopy221 topic
- Quantum Size Effects211 topic
- Superconductivity211 topic
- Dimensional Metrology191 topic
- Error Compensation191 topic
- Chemical Mechanical Planarization181 topic
- Material Removal Mechanism181 topic
- Roughness Measurement141 topic
- Surface Characterization141 topic
Where does Ndubuisi G. Orji work?
Ndubuisi G. Orji's main affiliation in the publication record is National Institute of Standards and Technology, United States.
How many publications and citations does Ndubuisi G. Orji have?
OpenAlex counts 108 works and 1,386 citations for Ndubuisi G. Orji, an h-index of 18, ranking #7,059,924 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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