O. L. Krivanek
O. L. Krivanek publishes mostly in Surfaces, Coatings and Films, Electrical and Electronic Engineering and Structural Biology, on topics such as Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications and Advanced Materials Characterization Techniques.
- World rank
- #3,483,857 of 7,710,434 ranked researchers
- Rank in United States
- #975,467 of 1,627,098
- Works
- 58
- Citations
- 1k
- Citations per work
- 17.7
What does O. L. Krivanek research?
O. L. Krivanek's work is mostly in Engineering (30%), Materials Science (29%), Biochemistry, Genetics and Molecular Biology (16%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3559.5%
- Engineering1830.4%
- Materials Science1729.1%
- Everything else1424.1%
- Life Sciences1016.4%
- 1Surfaces, Coatings and Films21% of their works
- 2Electrical and Electronic Engineering17% of their works
- 3Structural Biology16% of their works
- 4Materials Chemistry8% of their works
- 5Biomedical Engineering7% of their works
- 6Computational Mechanics6% of their works
Research topics
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
- Semiconductor materials and devices
- Ion-surface interactions and analysis
- Advanced ceramic materials synthesis
- Advanced X-ray Imaging Techniques
- Silicon and Solar Cell Technologies
Which keywords describe O. L. Krivanek's research?
The keywords of their largest research topics: Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Cryo-Electron Microscopy, Single-Particle Analysis, Atom Probe Tomography, Atomic Layer Deposition, High-k Dielectrics and Three-Dimensional Analysis.
- Solar Cells
- X-ray Imaging
- Sintering
- Surface Analysis
- Three-Dimensional Analysis
- Atomic Layer Deposition
- Single-Particle Analysis
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Cryo-Electron Microscopy
- Atom Probe Tomography
- High-k Dielectrics
- Ion Beam
- Ceramic Materials
- Phase Retrieval
- Silicon
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Scanning Electron Microscopy351 topic
- X-ray Photoelectron Spectroscopy351 topic
- Cryo-Electron Microscopy271 topic
- Single-Particle Analysis271 topic
- Atom Probe Tomography101 topic
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Three-Dimensional Analysis101 topic
- Ion Beam81 topic
- Surface Analysis81 topic
- Ceramic Materials61 topic
- Sintering61 topic
- Phase Retrieval51 topic
- X-ray Imaging51 topic
- Silicon41 topic
- Solar Cells41 topic
Where does O. L. Krivanek work?
O. L. Krivanek's main affiliation in the publication record is Nion (United States), United States.
How many publications and citations does O. L. Krivanek have?
OpenAlex counts 58 works and 1,026 citations for O. L. Krivanek, an h-index of 14, ranking #3,483,857 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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