O. Saxod
O. Saxod publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Instrumentation, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #3,570,834 of 7,710,434 ranked researchers
- Rank in France
- #150,547 of 324,115
- Works
- 15
- Citations
- 712
- Citations per work
- 47.5
What does O. Saxod research?
O. Saxod's work is mostly in Engineering (73%), Physics and Astronomy (23%), Biochemistry, Genetics and Molecular Biology (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1495.5%
- Engineering1172.8%
- Physics and Astronomy322.7%
- Life Sciences02.3%
- Health Sciences02.3%
- Medicine02.3%
- 1Electrical and Electronic Engineering70% of their works
- 2Atomic and Molecular Physics, and Optics14% of their works
- 3Instrumentation9% of their works
- 4Biophysics2% of their works
- 5Radiology, Nuclear Medicine and Imaging2% of their works
- 6Biomedical Engineering2% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Optical Sensing Technologies
- Electrostatic Discharge in Electronics
- Radio Frequency Integrated Circuit Design
- Advanced Semiconductor Detectors and Materials
- 3D IC and TSV technologies
Which keywords describe O. Saxod's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Integrated Circuits, Failure Analysis, Laser Ranging and Photon Emission Microscopy.
- Semiconductor Materials
- Interconnect
- ESD Protection
- CMOS
- Photon Emission Microscopy
- Failure Analysis
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- Atomic Layer Deposition
- Nanowire Transistors
- Integrated Circuits
- Laser Ranging
- Time-of-Flight
- CMOS Technology
- Infrared Detectors
- Oscillators
- Through-Silicon Via
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Atomic Layer Deposition71 topic
- High-k Dielectrics71 topic
- Nanowire Transistors71 topic
- Tunnel Field-Effect Transistors71 topic
- Integrated Circuits62 topics
- Failure Analysis41 topic
- Laser Ranging41 topic
- Photon Emission Microscopy41 topic
- Time-of-Flight41 topic
- CMOS21 topic
- CMOS Technology21 topic
- ESD Protection21 topic
- Infrared Detectors21 topic
- Interconnect21 topic
- Oscillators21 topic
- Semiconductor Materials21 topic
- Through-Silicon Via21 topic
Where does O. Saxod work?
O. Saxod's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does O. Saxod have?
OpenAlex counts 15 works and 712 citations for O. Saxod, an h-index of 6, ranking #3,570,834 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
Ask a question or share a note about O. Saxod. Keep it to the research: no personal attacks, advertising or links. Any reader can report a post, which collapses it for everyone until it is opened.