Researcher · ASML (Netherlands) · Netherlands
Peter Nikolsky
Peter Nikolsky publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.
- World rank
- #4,815,339 of 7,710,434 ranked researchers
- Rank in Netherlands
- #86,833 of 107,149
- Works
- 21
- Citations
- 156
- Citations per work
- 7.4
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