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Researcher · ASML (Netherlands) · Netherlands

Peter Nikolsky

Peter Nikolsky publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.

OpenAlex
World rank
#4,815,339
of 7,710,434 ranked researchers
Rank in Netherlands
#86,833
of 107,149
Works
21
Citations
156
Citations per work
7.4
h-index
6
i10-index 4Top 82% in Electrical and Electronic Engineering
Peter Nikolsky

What does Peter Nikolsky research?

Peter Nikolsky's work is mostly in Engineering (84%), Materials Science (13%), Computer Science (2%).

Physical Sciences: 21 works · 98.4% of their workEngineering: 18 works · 84.1% of their workElectrical and Electronic Engineering: 13 works · 60.3% of their workIndustrial and Manufacturing Engineering: 3 works · 14.3% of their workBiomedical Engineering: 2 works · 7.9% of their workMechanical Engineering: 0 works · 1.6% of their workMaterials Science: 3 works · 12.7% of their workSurfaces, Coatings and Films: 3 works · 12.7% of their workComputer Science: 0 works · 1.6% of their workComputer Vision and Pattern Recognition: 0 works · 1.6% of their workTHEIR WORKPeter Nikolsky21works
Physical Sciences98%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1884.1%
    2. Materials Science312.7%
    3. Computer Science01.6%
  1. 1Electrical and Electronic Engineering60% of their works
  2. 2Industrial and Manufacturing Engineering14% of their works
  3. 3Surfaces, Coatings and Films13% of their works
  4. 4Biomedical Engineering8% of their works
  5. 5Computer Vision and Pattern Recognition2% of their works
  6. 6Mechanical Engineering2% of their works

Research topics

Which keywords describe Peter Nikolsky's research?

The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Fabric Defect Detection, Machine Vision, Scanning Electron Microscopy and X-ray Photoelectron Spectroscopy.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.

All 16 words, with their numbers
  1. Electron Beam Lithography211 topic
  2. Nanofabrication211 topic
  3. Failure Analysis91 topic
  4. Integrated Circuits91 topic
  5. Fabric Defect Detection81 topic
  6. Machine Vision81 topic
  7. Scanning Electron Microscopy71 topic
  8. X-ray Photoelectron Spectroscopy71 topic
  9. Chemical Mechanical Planarization41 topic
  10. Interconnect41 topic
  11. Material Removal Mechanism41 topic
  12. Through-Silicon Via41 topic
  13. Atomic Layer Deposition21 topic
  14. High-k Dielectrics21 topic
  15. Camera Calibration11 topic
  16. Structured Light11 topic

Where does Peter Nikolsky work?

Peter Nikolsky's main affiliation in the publication record is ASML (Netherlands), Netherlands.

How many publications and citations does Peter Nikolsky have?

OpenAlex counts 21 works and 156 citations for Peter Nikolsky, an h-index of 6, ranking #4,815,339 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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