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Researcher · Aix-Marseille Université · France

R. Rivoira

R. Rivoira publishes mostly in Electrical and Electronic Engineering, Radiation and Materials Chemistry, on topics such as Advanced X-ray Imaging Techniques, Surface Roughness and Optical Measurements and Advanced Surface Polishing Techniques.

OpenAlex
World rank
#7,280,174
of 7,710,434 ranked researchers
Rank in France
#306,456
of 324,115
Works
41
Citations
350
Citations per work
8.5
h-index
11
i10-index 14Top 47% in Electrical and Electronic Engineering
R. Rivoira

What does R. Rivoira research?

R. Rivoira's work is mostly in Engineering (25%), Physics and Astronomy (24%), Materials Science (18%).

Physical Sciences: 28 works · 67.2% of their workEngineering: 10 works · 25.0% of their workElectrical and Electronic Engineering: 7 works · 16.4% of their workComputational Mechanics: 4 works · 8.6% of their workPhysics and Astronomy: 10 works · 24.1% of their workRadiation: 6 works · 15.5% of their workAtomic and Molecular Physics, and Optics: 4 works · 8.6% of their workMaterials Science: 7 works · 18.1% of their workMaterials Chemistry: 4 works · 9.5% of their workSurfaces, Coatings and Films: 4 works · 8.6% of their workEverything else: 13 works · 32.8% of their workTHEIR WORKR. Rivoira41works
Physical Sciences67%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1025.0%
    2. Physics and Astronomy1024.1%
    3. Materials Science718.1%
  2. Everything else1332.8%
  1. 1Electrical and Electronic Engineering16% of their works
  2. 2Radiation16% of their works
  3. 3Materials Chemistry10% of their works
  4. 4Computational Mechanics9% of their works
  5. 5Atomic and Molecular Physics, and Optics9% of their works
  6. 6Surfaces, Coatings and Films9% of their works

Research topics

Which keywords describe R. Rivoira's research?

The keywords of their largest research topics: Thin Films, Spectroscopy, Phase Retrieval, X-ray Imaging, Roughness Measurement, Surface Characterization, Chemical Mechanical Planarization and Material Removal Mechanism.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 18 words, with their numbers
  1. Thin Films143 topics
  2. Spectroscopy112 topics
  3. Phase Retrieval101 topic
  4. X-ray Imaging101 topic
  5. Roughness Measurement91 topic
  6. Surface Characterization91 topic
  7. Chemical Mechanical Planarization81 topic
  8. Material Removal Mechanism81 topic
  9. Antireflective Coatings61 topic
  10. Nanostructures61 topic
  11. Coatings51 topic
  12. Nanoindentation51 topic
  13. Quantum Size Effects51 topic
  14. Superconductivity51 topic
  15. X-ray Absorption51 topic
  16. X-ray Emission51 topic
  17. Low-k Dielectrics41 topic
  18. Microelectronics41 topic

Where does R. Rivoira work?

R. Rivoira's main affiliation in the publication record is Aix-Marseille Université, France.

How many publications and citations does R. Rivoira have?

OpenAlex counts 41 works and 350 citations for R. Rivoira, an h-index of 11, ranking #7,280,174 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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