Rudolf Schlangen
Rudolf Schlangen publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices and Thermography and Photoacoustic Techniques.
- World rank
- #6,598,832 of 7,710,434 ranked researchers
- Rank in United States
- #1,536,418 of 1,627,098
- Works
- 40
- Citations
- 264
- Citations per work
- 6.6
What does Rudolf Schlangen research?
Rudolf Schlangen's work is mostly in Engineering (70%), Physics and Astronomy (8%), Computer Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3485.8%
- Engineering2870.0%
- Physics and Astronomy38.3%
- Computer Science37.5%
- Everything else614.2%
- 1Electrical and Electronic Engineering48% of their works
- 2Biomedical Engineering9% of their works
- 3Atomic and Molecular Physics, and Optics8% of their works
- 4Mechanics of Materials8% of their works
- 5Hardware and Architecture8% of their works
- 6Computational Mechanics5% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Thermography and Photoacoustic Techniques
- Force Microscopy Techniques and Applications
- VLSI and Analog Circuit Testing
- Advanced Surface Polishing Techniques
- Ion-surface interactions and analysis
- Industrial Vision Systems and Defect Detection
Which keywords describe Rudolf Schlangen's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Atomic Layer Deposition, High-k Dielectrics, Atomic Force Microscopy, Force Spectroscopy, Infrared Thermography and Non-Destructive Testing.
- Machine Vision
- Surface Analysis
- Ion Beam
- Test Data Compression
- Non-Destructive Testing
- Force Spectroscopy
- High-k Dielectrics
- Integrated Circuits
- Failure Analysis
- Atomic Layer Deposition
- Atomic Force Microscopy
- Infrared Thermography
- Embedded Cores
- Chemical Mechanical Planarization
- Material Removal Mechanism
- Fabric Defect Detection
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Failure Analysis391 topic
- Integrated Circuits391 topic
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Atomic Force Microscopy91 topic
- Force Spectroscopy91 topic
- Infrared Thermography91 topic
- Non-Destructive Testing91 topic
- Embedded Cores81 topic
- Test Data Compression81 topic
- Chemical Mechanical Planarization61 topic
- Ion Beam61 topic
- Material Removal Mechanism61 topic
- Surface Analysis61 topic
- Fabric Defect Detection51 topic
- Machine Vision51 topic
Where does Rudolf Schlangen work?
Rudolf Schlangen's main affiliation in the publication record is Nvidia (United States), United States.
How many publications and citations does Rudolf Schlangen have?
OpenAlex counts 40 works and 264 citations for Rudolf Schlangen, an h-index of 9, ranking #6,598,832 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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