Sylvain Dudit
Sylvain Dudit publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Force Microscopy Techniques and Applications.
- World rank
- #7,390,946 of 7,710,434 ranked researchers
- Rank in France
- #310,532 of 324,115
- Works
- 29
- Citations
- 124
- Citations per work
- 4.3
What does Sylvain Dudit research?
Sylvain Dudit's work is mostly in Engineering (68%), Computer Science (14%), Physics and Astronomy (10%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2794.2%
- Engineering2067.8%
- Computer Science413.8%
- Physics and Astronomy310.3%
- Materials Science12.3%
- Everything else25.8%
- 1Electrical and Electronic Engineering54% of their works
- 2Hardware and Architecture14% of their works
- 3Atomic and Molecular Physics, and Optics10% of their works
- 4Industrial and Manufacturing Engineering7% of their works
- 5Biomedical Engineering7% of their works
- 6Surfaces, Coatings and Films2% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Force Microscopy Techniques and Applications
- Electrostatic Discharge in Electronics
- Semiconductor materials and devices
- Industrial Vision Systems and Defect Detection
- Advanced Surface Polishing Techniques
- Near-Field Optical Microscopy
Which keywords describe Sylvain Dudit's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, Atomic Force Microscopy, Force Spectroscopy, CMOS Technology and ESD Protection.
- Photonic Nanojets
- Material Removal Mechanism
- Machine Vision
- Fabric Defect Detection
- ESD Protection
- Force Spectroscopy
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Atomic Force Microscopy
- CMOS Technology
- Atomic Layer Deposition
- High-k Dielectrics
- Chemical Mechanical Planarization
- Near-Field Optical Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Failure Analysis281 topic
- Integrated Circuits281 topic
- Embedded Cores111 topic
- Test Data Compression111 topic
- Atomic Force Microscopy91 topic
- Force Spectroscopy91 topic
- CMOS Technology71 topic
- ESD Protection71 topic
- Atomic Layer Deposition61 topic
- Fabric Defect Detection61 topic
- High-k Dielectrics61 topic
- Machine Vision61 topic
- Chemical Mechanical Planarization31 topic
- Material Removal Mechanism31 topic
- Near-Field Optical Microscopy31 topic
- Photonic Nanojets31 topic
Where does Sylvain Dudit work?
Sylvain Dudit's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does Sylvain Dudit have?
OpenAlex counts 29 works and 124 citations for Sylvain Dudit, an h-index of 6, ranking #7,390,946 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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