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Researcher · ASML (Netherlands) · Netherlands

Ton Kiers

Ton Kiers publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Industrial and Manufacturing Engineering, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Integrated Circuits and Semiconductor Failure Analysis.

OpenAlex
World rank
#6,878,996
of 7,710,434 ranked researchers
Rank in Netherlands
#104,031
of 107,149
Works
18
Citations
107
Citations per work
5.9
h-index
5
i10-index 5Top 89% in Electrical and Electronic Engineering
Ton Kiers

What does Ton Kiers research?

Ton Kiers's work is mostly in Engineering (69%), Materials Science (24%), Neuroscience (2%).

Physical Sciences: 17 works · 93.2% of their workEngineering: 12 works · 68.8% of their workElectrical and Electronic Engineering: 9 works · 48.9% of their workIndustrial and Manufacturing Engineering: 2 works · 11.1% of their workBiomedical Engineering: 1 works · 4.4% of their workComputational Mechanics: 1 works · 4.4% of their workMaterials Science: 4 works · 24.4% of their workSurfaces, Coatings and Films: 4 works · 24.4% of their workEverything else: 1 works · 4.6% of their workLife Sciences: 0 works · 2.2% of their workNeuroscience: 0 works · 2.2% of their workCognitive Neuroscience: 0 works · 2.2% of their workTHEIR WORKTon Kiers18works
Life Sciences2%Physical Sciences93%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1268.8%
    2. Materials Science424.4%
  2. Everything else14.6%
    1. Neuroscience02.2%
  1. 1Electrical and Electronic Engineering49% of their works
  2. 2Surfaces, Coatings and Films24% of their works
  3. 3Industrial and Manufacturing Engineering11% of their works
  4. 4Computational Mechanics4% of their works
  5. 5Biomedical Engineering4% of their works
  6. 6Cognitive Neuroscience2% of their works

Research topics

Which keywords describe Ton Kiers's research?

The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Machine Vision, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Antireflective Coatings and Fabric Defect Detection.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.

All 18 words, with their numbers
  1. Nanofabrication182 topics
  2. Electron Beam Lithography131 topic
  3. Resolution Limits131 topic
  4. Machine Vision72 topics
  5. Scanning Electron Microscopy61 topic
  6. X-ray Photoelectron Spectroscopy61 topic
  7. Antireflective Coatings51 topic
  8. Fabric Defect Detection51 topic
  9. Failure Analysis51 topic
  10. Integrated Circuits51 topic
  11. Nanostructures51 topic
  12. Texture Analysis51 topic
  13. Chemical Mechanical Planarization21 topic
  14. Material Removal Mechanism21 topic
  15. Roughness Measurement21 topic
  16. Surface Characterization21 topic
  17. Neural Processing11 topic
  18. Visual Perception11 topic

Where does Ton Kiers work?

Ton Kiers's main affiliation in the publication record is ASML (Netherlands), Netherlands.

How many publications and citations does Ton Kiers have?

OpenAlex counts 18 works and 107 citations for Ton Kiers, an h-index of 5, ranking #6,878,996 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

Discussion

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