Wim de Boeij
Wim de Boeij publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Advanced Surface Polishing Techniques and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #5,092,532 of 7,710,434 ranked researchers
- Rank in Netherlands
- #89,992 of 107,149
- Works
- 20
- Citations
- 247
- Citations per work
- 12.4
What does Wim de Boeij research?
Wim de Boeij's work is mostly in Engineering (66%), Materials Science (12%), Physics and Astronomy (5%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1786.2%
- Engineering1365.5%
- Materials Science212.1%
- Physics and Astronomy15.2%
- Computer Science13.4%
- Everything else313.8%
- 1Electrical and Electronic Engineering41% of their works
- 2Biomedical Engineering21% of their works
- 3Surfaces, Coatings and Films12% of their works
- 4Atomic and Molecular Physics, and Optics5% of their works
- 5Industrial and Manufacturing Engineering3% of their works
- 6Computer Vision and Pattern Recognition3% of their works
Research topics
- Advancements in Photolithography Techniques
- Advanced Surface Polishing Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Optical Coatings and Gratings
- Advanced optical system design
- Optical measurement and interference techniques
- Electron and X-Ray Spectroscopy Techniques
- Adaptive optics and wavefront sensing
Which keywords describe Wim de Boeij's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Chemical Mechanical Planarization, Material Removal Mechanism, Failure Analysis, Integrated Circuits and Antireflective Coatings.
- Wavefront Sensing
- Scanning Electron Microscopy
- Adaptive Optics
- Compound Eyes
- Antireflective Coatings
- Failure Analysis
- Chemical Mechanical Planarization
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- Material Removal Mechanism
- Integrated Circuits
- Nanostructures
- Freeform Optics
- Camera Calibration
- Structured Light
- X-ray Photoelectron Spectroscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Nanofabrication222 topics
- Electron Beam Lithography171 topic
- Resolution Limits171 topic
- Chemical Mechanical Planarization81 topic
- Material Removal Mechanism81 topic
- Failure Analysis61 topic
- Integrated Circuits61 topic
- Antireflective Coatings51 topic
- Nanostructures51 topic
- Compound Eyes31 topic
- Freeform Optics31 topic
- Adaptive Optics21 topic
- Camera Calibration21 topic
- Scanning Electron Microscopy21 topic
- Structured Light21 topic
- Wavefront Sensing21 topic
- X-ray Photoelectron Spectroscopy21 topic
Where does Wim de Boeij work?
Wim de Boeij's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Wim de Boeij have?
OpenAlex counts 20 works and 247 citations for Wim de Boeij, an h-index of 10, ranking #5,092,532 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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