A. Balasiński
A. Balasiński publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Hardware and Architecture, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Semiconductor materials and devices.
- World rank
- #734,839 of 1,633,909 ranked researchers
- Rank in United States
- #216,653 of 358,040
- Works
- 27
- Citations
- 63
- Citations per work
- 2.3
What does A. Balasiński research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering82% of their works
- 2Industrial and Manufacturing Engineering7% of their works
- 3Hardware and Architecture4% of their works
- 4Biomedical Engineering2% of their works
- 5Surfaces, Coatings and Films2% of their works
- 6Management of Technology and Innovation2% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
- VLSI and FPGA Design Techniques
- VLSI and Analog Circuit Testing
- Silicon and Solar Cell Technologies
Which keywords describe A. Balasiński's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, ASIC, Atomic Layer Deposition, FPGA and High-k Dielectrics.
- Test Data Compression
- Silicon
- Tunnel Field-Effect Transistors
- Nanowire Transistors
- High-k Dielectrics
- Atomic Layer Deposition
- Integrated Circuits
- Nanofabrication
- Electron Beam Lithography
- Failure Analysis
- ASIC
- FPGA
- Interconnect
- Through-Silicon Via
- Embedded Cores
- Solar Cells
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Electron Beam Lithography111 topic
- Nanofabrication111 topic
- Failure Analysis61 topic
- Integrated Circuits61 topic
- ASIC31 topic
- Atomic Layer Deposition31 topic
- FPGA31 topic
- High-k Dielectrics31 topic
- Interconnect31 topic
- Nanowire Transistors31 topic
- Through-Silicon Via31 topic
- Tunnel Field-Effect Transistors31 topic
- Embedded Cores21 topic
- Silicon21 topic
- Solar Cells21 topic
- Test Data Compression21 topic
Where does A. Balasiński work?
A. Balasiński's main affiliation in the publication record is Cypress Semiconductor Corporation (United States), United States.
How many publications and citations does A. Balasiński have?
Science Explorer counts 27 works and 63 citations for A. Balasiński, ranking #734,839 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.