Alex Zepka
Alex Zepka publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Mechanical Engineering, on topics such as Advancements in Photolithography Techniques, Industrial Vision Systems and Defect Detection and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #6,797,869 of 7,710,434 ranked researchers
- Rank in United States
- #1,556,457 of 1,627,098
- Works
- 17
- Citations
- 44
- Citations per work
- 2.6
What does Alex Zepka research?
Alex Zepka's work is mostly in Engineering (74%), Materials Science (11%), Computer Science (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1693.4%
- Engineering1373.9%
- Materials Science210.9%
- Computer Science14.3%
- Physics and Astronomy14.3%
- Everything else16.6%
- 1Electrical and Electronic Engineering41% of their works
- 2Industrial and Manufacturing Engineering17% of their works
- 3Mechanical Engineering15% of their works
- 4Surfaces, Coatings and Films11% of their works
- 5Hardware and Architecture4% of their works
- 6Radiation4% of their works
Research topics
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Manufacturing Process and Optimization
- Advanced Measurement and Metrology Techniques
- Welding Techniques and Residual Stresses
- VLSI and Analog Circuit Testing
Which keywords describe Alex Zepka's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Fabric Defect Detection, Machine Vision, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Failure Analysis and Integrated Circuits.
- Test Data Compression
- Welding
- Error Compensation
- Design for Manufacture
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Machine Vision
- Nanofabrication
- Electron Beam Lithography
- Fabric Defect Detection
- Scanning Electron Microscopy
- Failure Analysis
- Assembly Planning
- Dimensional Metrology
- Residual Stress
- Embedded Cores
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Electron Beam Lithography131 topic
- Nanofabrication131 topic
- Fabric Defect Detection51 topic
- Machine Vision51 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Failure Analysis41 topic
- Integrated Circuits41 topic
- Assembly Planning31 topic
- Design for Manufacture31 topic
- Dimensional Metrology31 topic
- Error Compensation31 topic
- Residual Stress31 topic
- Welding31 topic
- Embedded Cores21 topic
- Test Data Compression21 topic
Where does Alex Zepka work?
Alex Zepka's main affiliation in the publication record is Synopsys (United States), United States.
How many publications and citations does Alex Zepka have?
OpenAlex counts 17 works and 44 citations for Alex Zepka, an h-index of 3, ranking #6,797,869 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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