Arjan Verhappen
Arjan Verhappen publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #6,630,675 of 7,710,434 ranked researchers
- Rank in Netherlands
- #102,822 of 107,149
- Works
- 15
- Citations
- 11
- Citations per work
- 0.7
What does Arjan Verhappen research?
Arjan Verhappen's work is mostly in Engineering (84%), Materials Science (16%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences15100.0%
- Engineering1384.4%
- Materials Science215.6%
- 1Electrical and Electronic Engineering71% of their works
- 2Surfaces, Coatings and Films16% of their works
- 3Biomedical Engineering7% of their works
- 4Computational Mechanics4% of their works
- 5Industrial and Manufacturing Engineering2% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Surface Roughness and Optical Measurements
- Semiconductor materials and devices
- Advanced Surface Polishing Techniques
- Nanofabrication and Lithography Techniques
- Near-Field Optical Microscopy
Which keywords describe Arjan Verhappen's research?
The keywords of their largest research topics: High-Resolution Patterning, Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy and Atomic Layer Deposition.
- Photonic Nanojets
- Nanolithography
- Chemical Mechanical Planarization
- Roughness Measurement
- Atomic Layer Deposition
- Scanning Electron Microscopy
- Failure Analysis
- Electron Beam Lithography
- High-Resolution Patterning
- Nanofabrication
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- High-k Dielectrics
- Surface Characterization
- Material Removal Mechanism
- Near-Field Optical Microscopy
- Soft Lithography
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- High-Resolution Patterning162 topics
- Electron Beam Lithography151 topic
- Nanofabrication151 topic
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Scanning Electron Microscopy61 topic
- X-ray Photoelectron Spectroscopy61 topic
- Atomic Layer Deposition21 topic
- High-k Dielectrics21 topic
- Roughness Measurement21 topic
- Surface Characterization21 topic
- Chemical Mechanical Planarization11 topic
- Material Removal Mechanism11 topic
- Nanolithography11 topic
- Near-Field Optical Microscopy11 topic
- Photonic Nanojets11 topic
- Soft Lithography11 topic
Where does Arjan Verhappen work?
Arjan Verhappen's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Arjan Verhappen have?
OpenAlex counts 15 works and 11 citations for Arjan Verhappen, an h-index of 2, ranking #6,630,675 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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