D. Appello
D. Appello publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Radiation Effects in Electronics.
- World rank
- #867,286 of 1,633,909 ranked researchers
- Rank in Italy
- #33,760 of 65,712
- Works
- 21
- Citations
- 41
- Citations per work
- 2.0
What does D. Appello research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering52% of their works
- 2Hardware and Architecture34% of their works
- 3Industrial and Manufacturing Engineering7% of their works
- 4Software3% of their works
- 5Mechanics of Materials3% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Industrial Vision Systems and Defect Detection
- Software Testing and Debugging Techniques
- Electrostatic Discharge in Electronics
- Metallurgy and Material Forming
Which keywords describe D. Appello's research?
The keywords of their largest research topics: Embedded Cores, Test Data Compression, Failure Analysis, Integrated Circuits, Nanoelectronics, CMOS Technology, Radiation Effects and Soft Errors.
- Software Fault Localization
- Hot Deformation
- Dynamic Recrystallization
- Machine Vision
- Fabric Defect Detection
- Soft Errors
- CMOS Technology
- Integrated Circuits
- Test Data Compression
- Embedded Cores
- Failure Analysis
- Nanoelectronics
- Radiation Effects
- Atomic Layer Deposition
- High-k Dielectrics
- Automated Testing
- ESD Protection
- SCR Devices
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Embedded Cores101 topic
- Test Data Compression101 topic
- Failure Analysis81 topic
- Integrated Circuits81 topic
- Nanoelectronics62 topics
- CMOS Technology52 topics
- Radiation Effects41 topic
- Soft Errors41 topic
- Atomic Layer Deposition21 topic
- Fabric Defect Detection21 topic
- High-k Dielectrics21 topic
- Machine Vision21 topic
- Automated Testing11 topic
- Dynamic Recrystallization11 topic
- ESD Protection11 topic
- Hot Deformation11 topic
- SCR Devices11 topic
- Software Fault Localization11 topic
Where does D. Appello work?
D. Appello's main affiliation in the publication record is STMicroelectronics (Italy), Italy.
How many publications and citations does D. Appello have?
Science Explorer counts 21 works and 41 citations for D. Appello, ranking #867,286 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.