Danping Peng
Danping Peng publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Industrial and Manufacturing Engineering, on topics such as Advancements in Photolithography Techniques, Electron and X-Ray Spectroscopy Techniques and Industrial Vision Systems and Defect Detection.
- World rank
- #2,389,561 of 7,710,434 ranked researchers
- Rank in United States
- #709,160 of 1,627,098
- Works
- 55
- Citations
- 2.8k
- Citations per work
- 51.4
What does Danping Peng research?
Danping Peng's work is mostly in Engineering (49%), Materials Science (17%), Computer Science (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3970.3%
- Engineering2749.3%
- Materials Science916.7%
- Computer Science24.3%
- Everything else1629.7%
- 1Electrical and Electronic Engineering30% of their works
- 2Surfaces, Coatings and Films17% of their works
- 3Industrial and Manufacturing Engineering10% of their works
- 4Computational Mechanics5% of their works
- 5Mechanical Engineering4% of their works
- 6Computer Vision and Pattern Recognition4% of their works
Research topics
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Industrial Vision Systems and Defect Detection
- Integrated Circuits and Semiconductor Failure Analysis
- Welding Techniques and Residual Stresses
- Optical measurement and interference techniques
- Optical Coatings and Gratings
- Computer Graphics and Visualization Techniques
Which keywords describe Danping Peng's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Fabric Defect Detection, Machine Vision and Failure Analysis.
- Computer Graphics
- Antireflective Coatings
- Camera Calibration
- Residual Stress
- Failure Analysis
- Fabric Defect Detection
- Scanning Electron Microscopy
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- X-ray Photoelectron Spectroscopy
- Machine Vision
- Integrated Circuits
- Welding
- Structured Light
- Nanostructures
- Visualization
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Nanofabrication402 topics
- Electron Beam Lithography371 topic
- Resolution Limits371 topic
- Scanning Electron Microscopy241 topic
- X-ray Photoelectron Spectroscopy241 topic
- Fabric Defect Detection161 topic
- Machine Vision161 topic
- Failure Analysis61 topic
- Integrated Circuits61 topic
- Residual Stress61 topic
- Welding61 topic
- Camera Calibration41 topic
- Structured Light41 topic
- Antireflective Coatings31 topic
- Nanostructures31 topic
- Computer Graphics21 topic
- Visualization21 topic
Where does Danping Peng work?
Danping Peng's main affiliation in the publication record is Luminex (United States), United States.
How many publications and citations does Danping Peng have?
OpenAlex counts 55 works and 2,828 citations for Danping Peng, an h-index of 13, ranking #2,389,561 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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