Francois Leverd
Francois Leverd publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #2,104,028 of 7,710,434 ranked researchers
- Rank in France
- #91,178 of 324,115
- Works
- 87
- Citations
- 1.5k
- Citations per work
- 16.7
What does Francois Leverd research?
Francois Leverd's work is mostly in Engineering (84%), Materials Science (5%), Physics and Astronomy (5%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences8395.0%
- Engineering7384.2%
- Materials Science55.4%
- Physics and Astronomy55.4%
- Everything else45.0%
- 1Electrical and Electronic Engineering78% of their works
- 2Atomic and Molecular Physics, and Optics5% of their works
- 3Biomedical Engineering4% of their works
- 4Electronic, Optical and Magnetic Materials4% of their works
- 5Materials Chemistry2% of their works
- 6Computational Mechanics2% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- 3D IC and TSV technologies
- Copper Interconnects and Reliability
- Semiconductor materials and interfaces
- Plasma Diagnostics and Applications
Which keywords describe Francois Leverd's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Failure Analysis, Integrated Circuits, Thin Films and Ferroelectricity.
- Plasma Etching
- Metal-Semiconductor Contacts
- Microelectronics
- Interconnect
- Ferroelectricity
- Integrated Circuits
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- Atomic Layer Deposition
- Nanowire Transistors
- Failure Analysis
- Thin Films
- Hafnium Oxide
- Low-k Dielectrics
- Through-Silicon Via
- Schottky Barrier
- Semiconductor Industry
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Atomic Layer Deposition621 topic
- High-k Dielectrics621 topic
- Nanowire Transistors461 topic
- Tunnel Field-Effect Transistors461 topic
- Failure Analysis251 topic
- Integrated Circuits251 topic
- Thin Films192 topics
- Ferroelectricity101 topic
- Hafnium Oxide101 topic
- Interconnect91 topic
- Low-k Dielectrics91 topic
- Microelectronics91 topic
- Through-Silicon Via91 topic
- Metal-Semiconductor Contacts81 topic
- Schottky Barrier81 topic
- Plasma Etching71 topic
- Semiconductor Industry71 topic
Where does Francois Leverd work?
Francois Leverd's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does Francois Leverd have?
OpenAlex counts 87 works and 1,455 citations for Francois Leverd, an h-index of 23, ranking #2,104,028 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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