F. Velardi
F. Velardi publishes mostly in Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Control and Systems Engineering, on topics such as Radiation Effects in Electronics, Electrostatic Discharge in Electronics and Silicon Carbide Semiconductor Technologies.
- World rank
- #521,091 of 1,633,909 ranked researchers
- Rank in Italy
- #18,657 of 65,712
- Works
- 23
- Citations
- 83
- Citations per work
- 3.6
What does F. Velardi research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering85% of their works
- 2Electronic, Optical and Magnetic Materials3% of their works
- 3Control and Systems Engineering3% of their works
- 4Mechanical Engineering3% of their works
- 5Condensed Matter Physics3% of their works
- 6Materials Chemistry3% of their works
Research topics
- Radiation Effects in Electronics
- Electrostatic Discharge in Electronics
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Piezoelectric Actuators and Control
- Advanced DC-DC Converters
Which keywords describe F. Velardi's research?
The keywords of their largest research topics: CMOS Technology, Nanoelectronics, Radiation Effects, Soft Errors, ESD Protection, Reliability, SCR Devices and Wide Bandgap Semiconductors.
- Power Electronics
- Hysteresis Compensation
- Tunnel Field-Effect Transistors
- Integrated Circuits
- High-k Dielectrics
- Wide Bandgap Semiconductors
- Reliability
- Soft Errors
- Nanoelectronics
- CMOS Technology
- Radiation Effects
- ESD Protection
- SCR Devices
- Atomic Layer Deposition
- Failure Analysis
- Nanowire Transistors
- DC-DC Converters
- Nanopositioning
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- CMOS Technology112 topics
- Nanoelectronics102 topics
- Radiation Effects61 topic
- Soft Errors61 topic
- ESD Protection51 topic
- Reliability51 topic
- SCR Devices51 topic
- Wide Bandgap Semiconductors51 topic
- Atomic Layer Deposition41 topic
- High-k Dielectrics41 topic
- Failure Analysis31 topic
- Integrated Circuits31 topic
- Nanowire Transistors21 topic
- Tunnel Field-Effect Transistors21 topic
- DC-DC Converters11 topic
- Hysteresis Compensation11 topic
- Nanopositioning11 topic
- Power Electronics11 topic
Where does F. Velardi work?
F. Velardi's main affiliation in the publication record is Università degli studi di Cassino e del Lazio Meridionale, Italy.
How many publications and citations does F. Velardi have?
Science Explorer counts 23 works and 83 citations for F. Velardi, ranking #521,091 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.