Gianluca Boselli
Gianluca Boselli publishes mostly in Electrical and Electronic Engineering and Hardware and Architecture, on topics such as Electrostatic Discharge in Electronics, Integrated Circuits and Semiconductor Failure Analysis and Semiconductor materials and devices.
- World rank
- #357,490 of 1,633,909 ranked researchers
- Rank in United States
- #129,730 of 358,040
- Works
- 23
- Citations
- 62
- Citations per work
- 2.7
What does Gianluca Boselli research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering95% of their works
- 2Hardware and Architecture5% of their works
Research topics
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
- VLSI and Analog Circuit Testing
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- 3D IC and TSV technologies
Which keywords describe Gianluca Boselli's research?
The keywords of their largest research topics: CMOS Technology, ESD Protection, SCR Devices, Failure Analysis, Integrated Circuits, Nanoelectronics, Atomic Layer Deposition and High-k Dielectrics.
- Tunnel Field-Effect Transistors
- Test Data Compression
- Radiation Effects
- Interconnect
- Electromagnetic Compatibility
- High-k Dielectrics
- Nanoelectronics
- Failure Analysis
- ESD Protection
- CMOS Technology
- SCR Devices
- Integrated Circuits
- Atomic Layer Deposition
- EMI
- Embedded Cores
- Nanowire Transistors
- Soft Errors
- Through-Silicon Via
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- CMOS Technology72 topics
- ESD Protection61 topic
- SCR Devices61 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Nanoelectronics52 topics
- Atomic Layer Deposition41 topic
- High-k Dielectrics41 topic
- EMI21 topic
- Electromagnetic Compatibility21 topic
- Embedded Cores11 topic
- Interconnect11 topic
- Nanowire Transistors11 topic
- Radiation Effects11 topic
- Soft Errors11 topic
- Test Data Compression11 topic
- Through-Silicon Via11 topic
- Tunnel Field-Effect Transistors11 topic
Where does Gianluca Boselli work?
Gianluca Boselli's main affiliation in the publication record is Texas Instruments (United States), United States.
How many publications and citations does Gianluca Boselli have?
Science Explorer counts 23 works and 62 citations for Gianluca Boselli, ranking #357,490 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.