Gijsbert Rispens
Gijsbert Rispens publishes mostly in Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #6,408,162 of 7,710,434 ranked researchers
- Rank in Netherlands
- #101,459 of 107,149
- Works
- 50
- Citations
- 513
- Citations per work
- 10.3
What does Gijsbert Rispens research?
Gijsbert Rispens's work is mostly in Engineering (72%), Materials Science (16%), Physics and Astronomy (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4691.9%
- Engineering3672.3%
- Materials Science816.2%
- Physics and Astronomy23.4%
- Everything else48.1%
- 1Electrical and Electronic Engineering58% of their works
- 2Surfaces, Coatings and Films16% of their works
- 3Biomedical Engineering8% of their works
- 4Industrial and Manufacturing Engineering4% of their works
- 5Radiation3% of their works
- 6Media Technology2% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Advanced Surface Polishing Techniques
- Advanced X-ray Imaging Techniques
- Industrial Vision Systems and Defect Detection
- Optical Coatings and Gratings
- Silicon and Solar Cell Technologies
Which keywords describe Gijsbert Rispens's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Failure Analysis, Integrated Circuits, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy and Chemical Mechanical Planarization.
- Silicon
- Nanostructures
- Fabric Defect Detection
- X-ray Imaging
- Solar Cells
- Chemical Mechanical Planarization
- Scanning Electron Microscopy
- Failure Analysis
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- Integrated Circuits
- X-ray Photoelectron Spectroscopy
- Material Removal Mechanism
- Phase Retrieval
- Antireflective Coatings
- Machine Vision
- Efficiency
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Nanofabrication502 topics
- Electron Beam Lithography461 topic
- Resolution Limits461 topic
- Failure Analysis321 topic
- Integrated Circuits321 topic
- Scanning Electron Microscopy201 topic
- X-ray Photoelectron Spectroscopy201 topic
- Chemical Mechanical Planarization81 topic
- Material Removal Mechanism81 topic
- Solar Cells72 topics
- Phase Retrieval51 topic
- X-ray Imaging51 topic
- Antireflective Coatings41 topic
- Fabric Defect Detection41 topic
- Machine Vision41 topic
- Nanostructures41 topic
- Efficiency31 topic
- Silicon31 topic
Where does Gijsbert Rispens work?
Gijsbert Rispens's main affiliation in the publication record is ASML (Netherlands), Netherlands.
How many publications and citations does Gijsbert Rispens have?
OpenAlex counts 50 works and 513 citations for Gijsbert Rispens, an h-index of 14, ranking #6,408,162 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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