Gilles Gasiot
Gilles Gasiot publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Radiation, on topics such as Radiation Effects in Electronics, Integrated Circuits and Semiconductor Failure Analysis and VLSI and Analog Circuit Testing.
- World rank
- #937,308 of 7,710,434 ranked researchers
- Rank in France
- #44,521 of 324,115
- Works
- 125
- Citations
- 2.6k
- Citations per work
- 20.5
What does Gilles Gasiot research?
Gilles Gasiot's work is mostly in Engineering (74%), Computer Science (14%), Physics and Astronomy (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences11793.8%
- Engineering9374.1%
- Computer Science1713.9%
- Physics and Astronomy64.5%
- Materials Science21.3%
- Everything else86.2%
- 1Electrical and Electronic Engineering72% of their works
- 2Hardware and Architecture14% of their works
- 3Radiation3% of their works
- 4Computational Mechanics2% of their works
- 5Instrumentation1% of their works
- 6Materials Chemistry1% of their works
Research topics
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Detection and Scintillator Technologies
- Ion-surface interactions and analysis
Which keywords describe Gilles Gasiot's research?
The keywords of their largest research topics: Nanoelectronics, CMOS Technology, Radiation Effects, Soft Errors, Failure Analysis, Integrated Circuits, Embedded Cores and Test Data Compression.
- Ion Beam
- Inorganic Scintillators
- Nanowire Transistors
- Low-Power
- High-k Dielectrics
- Test Data Compression
- Integrated Circuits
- Soft Errors
- CMOS Technology
- Nanoelectronics
- Radiation Effects
- Failure Analysis
- Embedded Cores
- Atomic Layer Deposition
- Process Variation
- VLSI Circuits
- Tunnel Field-Effect Transistors
- Scintillation Detectors
- Surface Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Nanoelectronics1512 topics
- CMOS Technology1232 topics
- Radiation Effects1021 topic
- Soft Errors1021 topic
- Failure Analysis611 topic
- Integrated Circuits611 topic
- Embedded Cores511 topic
- Test Data Compression511 topic
- Atomic Layer Deposition491 topic
- High-k Dielectrics491 topic
- Process Variation402 topics
- Low-Power211 topic
- VLSI Circuits211 topic
- Nanowire Transistors191 topic
- Tunnel Field-Effect Transistors191 topic
- Inorganic Scintillators101 topic
- Scintillation Detectors101 topic
- Ion Beam81 topic
- Surface Analysis81 topic
Where does Gilles Gasiot work?
Gilles Gasiot's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does Gilles Gasiot have?
OpenAlex counts 125 works and 2,562 citations for Gilles Gasiot, an h-index of 29, ranking #937,308 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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