Hung Sung Lin
Hung Sung Lin publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #6,704,062 of 7,710,434 ranked researchers
- Rank in Taiwan
- #51,252 of 57,035
- Works
- 16
- Citations
- 40
- Citations per work
- 2.5
What does Hung Sung Lin research?
Hung Sung Lin's work is mostly in Engineering (69%), Materials Science (11%), Physics and Astronomy (11%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences16100.0%
- Engineering1168.9%
- Materials Science211.1%
- Physics and Astronomy211.1%
- Computer Science18.9%
- 1Electrical and Electronic Engineering62% of their works
- 2Atomic and Molecular Physics, and Optics11% of their works
- 3Surfaces, Coatings and Films11% of their works
- 4Hardware and Architecture9% of their works
- 5Computational Mechanics7% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Electron and X-Ray Spectroscopy Techniques
- Advancements in Semiconductor Devices and Circuit Design
- Force Microscopy Techniques and Applications
- Ion-surface interactions and analysis
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
Which keywords describe Hung Sung Lin's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Atomic Layer Deposition, High-k Dielectrics, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Atomic Force Microscopy and Force Spectroscopy.
- Test Data Compression
- Hardware Trojans
- Surface Analysis
- Tunnel Field-Effect Transistors
- Force Spectroscopy
- X-ray Photoelectron Spectroscopy
- High-k Dielectrics
- Integrated Circuits
- Failure Analysis
- Atomic Layer Deposition
- Scanning Electron Microscopy
- Atomic Force Microscopy
- Nanowire Transistors
- Ion Beam
- Embedded Cores
- Physical Unclonable Functions
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Atomic Layer Deposition81 topic
- High-k Dielectrics81 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- Atomic Force Microscopy41 topic
- Force Spectroscopy41 topic
- Nanowire Transistors41 topic
- Tunnel Field-Effect Transistors41 topic
- Ion Beam31 topic
- Surface Analysis31 topic
- Embedded Cores21 topic
- Hardware Trojans21 topic
- Physical Unclonable Functions21 topic
- Test Data Compression21 topic
Where does Hung Sung Lin work?
Hung Sung Lin's main affiliation in the publication record is United Microelectronics (Taiwan), Taiwan.
How many publications and citations does Hung Sung Lin have?
OpenAlex counts 16 works and 40 citations for Hung Sung Lin, an h-index of 3, ranking #6,704,062 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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