J. Fung Chen
J. Fung Chen publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #5,967,402 of 7,710,434 ranked researchers
- Rank in United States
- #1,457,202 of 1,627,098
- Works
- 16
- Citations
- 101
- Citations per work
- 6.3
What does J. Fung Chen research?
J. Fung Chen's work is mostly in Engineering (86%), Materials Science (10%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1595.9%
- Engineering1485.5%
- Materials Science210.4%
- Everything else14.1%
- 1Electrical and Electronic Engineering60% of their works
- 2Biomedical Engineering12% of their works
- 3Surfaces, Coatings and Films10% of their works
- 4Industrial and Manufacturing Engineering6% of their works
- 5Computational Mechanics4% of their works
- 6Mechanical Engineering2% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Advanced optical system design
- Industrial Vision Systems and Defect Detection
- Surface Roughness and Optical Measurements
- Silicon and Solar Cell Technologies
- Advanced Surface Polishing Techniques
Which keywords describe J. Fung Chen's research?
The keywords of their largest research topics: Electron Beam Lithography, Nanofabrication, Failure Analysis, Integrated Circuits, Machine Vision, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy and Compound Eyes.
- Chemical Mechanical Planarization
- Solar Cells
- Roughness Measurement
- Freeform Optics
- Compound Eyes
- Scanning Electron Microscopy
- Integrated Circuits
- Nanofabrication
- Electron Beam Lithography
- Failure Analysis
- Machine Vision
- X-ray Photoelectron Spectroscopy
- Fabric Defect Detection
- Texture Analysis
- Silicon
- Surface Characterization
- Material Removal Mechanism
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Electron Beam Lithography151 topic
- Nanofabrication151 topic
- Failure Analysis101 topic
- Integrated Circuits101 topic
- Machine Vision52 topics
- Scanning Electron Microscopy41 topic
- X-ray Photoelectron Spectroscopy41 topic
- Compound Eyes31 topic
- Fabric Defect Detection31 topic
- Freeform Optics31 topic
- Texture Analysis31 topic
- Roughness Measurement21 topic
- Silicon21 topic
- Solar Cells21 topic
- Surface Characterization21 topic
- Chemical Mechanical Planarization11 topic
- Material Removal Mechanism11 topic
Where does J. Fung Chen work?
J. Fung Chen's main affiliation in the publication record is Micro Systems Engineering (United States), United States.
How many publications and citations does J. Fung Chen have?
OpenAlex counts 16 works and 101 citations for J. Fung Chen, an h-index of 5, ranking #5,967,402 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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